Litesentry Corporation

Scattermaster, LLC

Eric Hegstrom

Mark Matthew Abbott

Douglas Wornson

John Clyde Stover

Bryan Nelson

Mark M Wornson

An apparatus and methods of inspecting, analyzing, classifying, and/or grading quality of a transparent sheet using a data set of photoelasticity measurements, thickness measurements, segmentation specifications, measurement specifications and quality control specifications of the transparent sheet. A results measurement is calculated on a computing system, quality control specifications are applied to the results measurement allowing writing to the database and creating reports, sending results to an operator interface and machine control.

Inspection, analysis, classification, and grading of transparent sheets using segmented datasets of photoelasticity measurements

This present invention relates to an apparatus and method for measuring the profile and reflective optical power of one or more surfaces of transparent sheets and transmissive optical power and thickness of one or more transparent sheets at a plurality of locations over the complete transparent sheet. The measurement results are presented to a user graphically and all data is stored for further processing, process control, and quality assurance.

Measurement of thickness, surface profile, and optical power of a transparent sheet

A hemispherical scanning optical scatterometer and method for its use for measuring scattered radiation, with a reflected scatter measurement laser, and/or a transmitted scatter measurement laser, an array of optical detectors, a computer controlled system to rotate the array of optical detectors, an electronic system, a computer interface and a computer for processing the signal.

Hemispherical scanning optical scatterometer

An apparatus which measures a size and a shape of a transparent sheet includes a conveyor, a lighting apparatus, an imaging device and a process controller. The conveyor moves the transparent sheet. The lighting apparatus projects light onto the transparent sheet. The imaging device receives reflected light reflected from the transparent sheet. A thickness is input into the process controller. A sheet temperature from a sheet temperature sensor and/or a structure temperature from a structure temperature sensor are output to the process controller. An image is output from the imaging device to the process controller. The process controller outputs the size and the shape of the transparent sheet. The outputs from the process controller are used to adjust machine tools used to fabricate the transparent sheet.

Automated online measurement of glass part geometry

A glass defect detection system comprising an apparatus and methods for the real-time inspection for defects in and on transparent sheets, such as a large sheets of glass is disclosed. The defect detection system utilizes a plurality of dark-field illumination systems and bright-field illumination systems and a plurality of baffles. A plurality of imaging devices are deployed to obtain images of transparent sheets. The defect detection system provides uniform lighting capable of equal detection of defects in all orientations and geometries. An image processing system analyzes for defects in and on the transparent sheet.

Defect detection lighting system and methods for large glass sheets

An apparatus and methods for the real-time inspection for defects in and on transparent sheets, such as a sheet of glass, are described. A sensor detects a transparent light reflective coating on a transparent sheet and defines a sample profile. An optical inspection system utilizes an illumination source and an imaging device to obtain images of the transparent sheets. An image processing system analyzes for defects in the transparent sheets, including coating defects and defects in edge deleted perimeters. Inspection variables which correspond to the sample profile are used by the optical inspection system and image processing system for real-time inspection.

Apparatus and methods for real-time adaptive inspection for glass production

A method and apparatus for detecting and measuring the optical distortion in pieces of glass and other reflective sheets are disclosed. The method inspects the full length and width of large area glass sheets or multiple sheets comprising a load of glass and uses optical magnification of a reflected circular image of precise size. A plurality of circular images is projected onto the glass and reflect as ellipsoids representative of local surface contours. The major and minor axes of the reflected axis define the axis of greatest magnification and demagnification. Distortions in the glass surface are measured in lens power as localized magnification at the elliptical axis. The angle and magnitude of the minor and major axis of the reflected ellipsoids provide data to map the surface profile of the glass. The method measures distortion of random or periodic frequency and measures distortion in all axes.

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Tucson, AZ, United States of America

Eric Hegstrom