Signal Microwave, LLC

Eric Gebhard

William Rosas

Brian Shumaker

Peter Frank

A high-frequency testing probe with a probe substrate and at least two probe tips. The probe substrate is a printed circuit board and the probe tips are coupled to and extend away from the printed circuit board. The first and second probe tips are each communicatively coupled to respective first and second probe connectors through respective first and second conducting traces disposed upon respective first and second sides of the printed circuit board. The probe connectors are configured to couple the testing probe to at least one of a high-frequency vector network analyzer and a high-frequency time domain reflectometer. The positions of the first ends of the first and second probe tips are adjustable. The first and second probe tips may be coupled to the first and second conducting traces through respective first and second joints, and may be configured to rotate about the first and second joints.

High-frequency data differential testing probe

A high-frequency testing probe having a probe substrate and at least two probe tips. The probe substrate is a printed circuit board and the probe tips are coupled to and extend outward from the printed circuit board. The first and second probe tips are each communicatively coupled to respective first and second probe connectors through respective first and second conducting traces disposed upon the printed circuit board. The probe connectors are configured to couple the testing probe to at least one of a high-frequency vector network analyzer and a high-frequency time domain reflectometer. The probe tips translate along their respective central longitudinal axes through respective adjustable couplings to modify respective distances the probe tips extend outward from the printed circuit board.

A high-frequency testing probe is disclosed. The probe includes a layered probe substrate having a first and second PCB, as well as first and second conducting traces disposed on opposite sides of the substrate. The probe substrate has an ungrounded differential region including two probe tips coupled to the traces, a grounded differential region, and a decoupled differential region including two probe connectors coupled to the traces. The probe also includes a ground plane between the two PCBs and between the two traces in the decoupled and grounded differential regions. In the ungrounded differential region, the first and second traces form a first differential transmission pair having a differential impedance. In the grounded differential region, the first and second traces form a second differential transmission pair having the differential impedance. The probe connectors are configured to couple to one of a vector network analyzer and a time domain reflectometer.

High-frequency layered testing probe

A microwave signal connector can comprise a first portion of an inner conductor comprising a first diameter. A second portion of the inner conductor comprises a second diameter less than the first diameter and is in contact with the first portion of the inner conductor. An outer conductor is disposed around the first portion of the inner conductor and the second portion of the inner conductor with a first inner diameter disposed over the first diameter and a second inner diameter disposed over the second diameter. A dielectric material is disposed between the second portion of the inner conductor and the outer conductor that extends along a length of the second portion of the inner conductor. An adhesive is attached to the dielectric material, the second portion of the inner conductor, and the outer conductor.

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Scottsdale, AZ, United States of America

Eric Gebhard