Seagate Technology Incorporated

Intel Corporations

Eric D Mudama

Andrew W Vogan

Bruce A Liikanen

John W Vanlaanen

John P Mead

Don Brunnett

David M Jones

Mike L Mallary

A method and system for wear leveling in a solid state drive by mapping the logical regions of the solid state drive that hold static content or information into the physical regions of the solid state drive that have erase counts more than an average erase count of all of the physical regions. By doing so, it allows the solid state drive to wear level itself naturally through continued usage. In one embodiment of the invention, the erase count of each physical region is incremented with every erasing operation of each physical region. The physical regions that have a high count of erase count operations are mapped with content of the logical regions with static content so that the possibility of future erase operations of these physical regions is reduced.

Method and system for wear leveling in a solid state drive

Methods and structures for appending metadata with recorded data in a dynamic mapped storage device. In a dynamically mapped storage device in which all user supplied logical blocks are dynamically mapped by the storage device controller to physical disk blocks, features and aspects hereof allow presently unused physical space to be used for storing additional metadata associated with recorded data. As the current capacity ratio of the storage device increases, appending of metadata may cease and previously recorded data including metadata may be re-recorded (migrated) to eliminate the appended metadata. The appended metadata may be used for enhanced diagnosis and analysis of characteristics of the operating storage device and may be used to restore the content of the storage device to an earlier state. The metadata may include, for example, track following position of the read/write head, temperature, head flying height, and time of day.

Methods and structure for dynamic appended metadata in a dynamically mapped mass storage device

Methods and structures for performing field flawscan to reduce manufacturing costs of a dynamic mapped storage device. In a dynamic mapped storage device in which all user supplied logical blocks are dynamically mapped by the storage device controller to physical disk blocks, features and aspects hereof permit flawscan testing of a storage device to be completed substantially concurrently with processing write requests for its intended application. A fraction of the storage device may be certified by an initial flawscan performed during manufacturing testing. Statistical sampling sufficient to assure a high probability of achieving specified capacity may be performed to reduce manufacturing time and costs in testing. Final flawscan of the remainder of the storage locations may be performed substantially concurrently with processing of write requests after the device is installed for its intended application. Mapping features and aspects hereof allow the storage device controller to perform flawscan and write operations concurrently.

Methods and structure for field flawscan in a dynamically mapped mass storage device

Methods and structures for dynamic density control to improve reliability of a dynamically mapped storage device. In a dynamically mapped storage device in which all user supplied logical blocks are dynamically mapped by the storage device controller to physical disk blocks, features and aspects hereof provide for dynamically altering the recording density of user data stored on the storage device. So long as the physical capacity utilization of the storage device permits, new data stored on the device may be stored at lower density to improve reliability in reading back the recorded data. Further features and aspects hereof may reduce the recording density only for data deemed to be critical. Radial (track) density, longitudinal (bit) density, or both may be dynamically controlled to reduce recording density. As physical capacity utilization increases, data previously recorded at lower density may be migrated (re-recorded) at normal higher density.

Growing community of inventors

Longmont, CO, United States of America

Eric D Mudama