Datashapes, Inc.

Datacopy Corporation

Rokio, Inc.

Eric C Schneider

Jeffrey Brian Adams

Tyson J Thomas

Michael P Kelley

Frank George Evans

Karl P Geiger

Kristopher Robert Buschelman

Timothy J Carruthers

Stuart D Rumley

Elaine Hebard

Methods, apparatuses and systems directed to pattern learning, recognition, and metrology. In some particular implementations, the invention provides a flexible pattern recognition platform including pattern recognition engines that can be dynamically adjusted to implement specific pattern recognition configurations for individual pattern recognition applications. In certain implementations, the present invention provides for methods and systems suitable for analyzing and recognizing patterns in biological signals such as multi-electrode array waveform data. In other implementations, the present invention also provides for a partition configuration where knowledge elements can be grouped and pattern recognition operations can be individually configured and arranged to allow for multi-level pattern recognition schemes. In other implementations, the present invention provides methods and systems for dynamic learning of patterns in supervised and unsupervised manners.

Pattern recognition system

A self-scanning linear array (10) is moved (12) in the image plane of a lens to thereby scan the image of an object which has been focused in the image plane. A random access controller controls random access to the information within the scanned image. Commands (14) including mechanical positional parameters (16) and electronic scan parameters (18) are decoded by the master microprocessor (20). The electronic scan parameters in the command provide information such as a user selected transverse axis frame size scan output of the array. An address generator (22) generates addresses in response to output pulses from the array. A windowing sequencer (24) in conjunction with the address generator (22) selectively gates particular ones of the pulses in the train of output pulses from the array in accordance with the electronic scan parameters in the command. The positional parameters (16) in the command provide information as to a user selected mechanical position of the array such as longitudinal axis frame size and longitudinal position axis seek. A position indicator (26) generates position representations in response to the physical position of the array (12), and a servo loop including slave processor (28), detents the array at the position representation corresponding to the selected mechanical position of the array as specified in the command decoded by the master microprocessor (20).

Random-access electronic camera

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Redwood City, CA, United States of America

Eric C Schneider