Micron Technology Incorporated

Eric A Becker

Tyler J Gomm

Brandon Roth

Eric Booth

Ross E Dermott

Scott Schafer

Debra M Bell

Scott D Van De Graaff

Michael Roth

Tyrel Z Jensen

Robert Tamlyn

An apparatus having a power bus supplying power to a component of a memory device. The apparatus includes a noise source circuit generating a plurality of noise source signals that simulate a real-world noise. The apparatus can include a pulse generator circuit that receives the noise source signal and outputs at least one noise profile signal based on the noise source signal. A bus shorting circuit can be connected to the pulse generator circuit to receive the at least one noise profile signal. The bus shorting circuit can have at least one transistor connected between a first rail and a second rail of the power bus. Based on the at least one noise profile signal, the bus shorting circuit intermittently connects the at least one transistor between the first rail to the second rail to induce noise on the power bus.

On-chip device testing circuit that generates noise on power bus of memory device

A time to digital circuit may provide a time measurement of an event, or a time measurement of a duration between multiple events. Various electronic devices may include one or more time to digital circuits. A time to digital circuit may include circuitry to use Thermometer Code for measuring the duration of the time. For example, the time to digital circuit may generate alternating signals using a ring oscillator when receiving an indication of an event. Moreover, the time to digital circuit may convert the alternating signals to a consistent signal with only one transition between high and low signals in multiple consecutive signals. Furthermore, the time to digital circuit may correct erroneous signal values of the consistent signals when multiple transitions between high and low signals in multiple consecutive signals occurs.

Time to digital circuitry with error protection scheme

Apparatus, systems, and methods disclosed herein may initialize a delay-locked loop (DLL) or phase-locked loop (PLL) to achieve a locked condition and may then initiate a quiescent mode of operation. Quiescent operation may be achieved by breaking a feedback loop associated with the DLL or PLL to prevent updates to a variable delay line associated with the DLL and/or to a variable frequency oscillator associated with the PLL. An output clock phase associated with the DLL or PLL may thus be held substantially constant following a DLL initialization period. Additional embodiments are disclosed and claimed.

Locked-loop quiescence apparatus, systems, and methods

This disclosure relates to delay line test circuits and methods. In one aspect, an integrated circuit (IC) can include a plurality of delay lines, a selection circuit, a delay comparison circuit, and a control circuit. The plurality of delay lines can generate a plurality of delayed clock signals, and the selection circuit can include a plurality of inputs configured to receive at least the plurality of delayed clock signals. The selection circuit can generate a first output clock signal and a second output clock signal by selecting amongst signals received at the plurality of inputs based on a state of a selection control signal. The delay comparison circuit can compare a delay of the first output clock signal to a delay of the second output clock signal and can generate a delay comparison such as a pass/fail flag based on the result. The control circuit can generate the selection control signal.

Apparatus and methods for delay line testing

Apparatuses and methods are disclosed, such as those including an oscillator circuit that generates an alternate clock. A multiplexing circuit can be coupled to the alternate clock and an input clock. The alternate clock has a more accurate duty cycle than the input clock. A clock path can be coupled to an output of the multiplexing circuit. The more accurate alternate clock can be coupled to the clock path during a test mode.

Methods and apparatuses for alternate clock selection

Apparatuses and methods for capturing data in a memory are disclosed herein. An apparatus may include a command path and a data capture logic. The command path may be configured to receive a command signal and to delay the command signal with a delay based, at least in part, on a plurality of propagation delays. The data capture logic may be coupled to the command path and configured to receive the delayed command signal and a data strobe signal. The data capture logic may further be configured to capture data according to the data strobe signal responsive, at least in part, to receipt of the delayed command signal.

Apparatuses and methods for capturing data in a memory

Closed-loop duty-cycle correctors (DCCs), clock generators, memory devices, systems, and methods for generating an output clock signal having a particular duty cycle are provided, such as clock generators configured to generate an output clock signal synchronized with a received input clock signal having a predetermined duty cycle. Embodiments of clock generators include closed-loop duty cycle correctors that receive an already-controlled and corrected output signal. For example, DLL control circuitry and DCC control circuitry may each adjust a delay of a variable delay line. The DLL control circuitry adjusts the delay such that an output clock signal is synchronized with an input clock signal. The DCC control circuitry detects a duty cycle error in the output clock signal and adjusts the delay of the variable delay line to achieve a duty cycle corrected output signal. By detecting the duty cycle error in the output signal, the clock generator may achieve improved performance that can correct accumulated duty cycle error and correct for duty cycle error introduced by the duty cycle corrector itself in some embodiments.

Clock generator and methods using closed loop duty cycle correction

A delay locked loop circuit and method of operating the same. The delay locked loop circuit comprises a forward delay path having a variable delay portion and a static delay portion, wherein the static delay portion includes a static delay element, a feedback path for generating a feedback signal responsive to an output signal, and a phase detector for comparing the phase of an input signal and the phase of the feedback signal and for generating a variable control signal for controlling the amount of delay provided by the variable delay portion, wherein the static delay element is activated in response to a static control signal indicative of the variable delay portion being unable to lock the output signal to the input signal. Because of the rules governing Abstracts, this Abstract should not be used to construe the claims.

Growing community of inventors

Boise, ID, United States of America

Eric A Becker