Semiconductor Energy Laboratory Co., Ltd.

Fuji Xerox Co., Ltd.

Eri Sato

Tatsuya Onuki

Yuto Yakubo

Hitoshi Kunitake

Kosuke Kubota

Hosana Kimura

Masateru Hattori

Hiroshi Shiota

A semiconductor device capable of measuring a minute current is provided. The semiconductor device includes an operational amplifier and a diode element. An inverting input terminal of the operational amplifier and an input terminal of the diode element are electrically connected to a first terminal to which current is input, and an output terminal of the operational amplifier and an output terminal of the diode element are electrically connected to a second terminal from which voltage is output. A diode-connected transistor that includes a metal oxide in a channel formation region is used as the diode element. Since the off-state current of the transistor is extremely low, a minute current can flow between the first terminal and the second terminal. Thus, when voltage is output from the second terminal, a minute current that flows through the first terminal can be estimated from the voltage.

Semiconductor device, semiconductor wafer, and electronic device

An information processing system includes a first display unit, a second display unit, and a control unit. If the first display unit that displays first operating instruction information indicating explanation of an operation receives an instruction to display second operating instruction information indicating explanation of a next operation, the control unit displays the second operating instruction information on the second display unit, and hides the first operating instruction information that is displayed on the first display unit.

Displaying help files on two display units in an image forming system

Growing community of inventors

Kanagawa, Japan

Eri Sato