Scopio Labs Ltd.

Eran Small

Erez Na'aman

Itai Hayut

Ben Leshem

Ittai Madar

Eyal Ben-Bassat

Chen Brestel

Ittay Madar

Erez Naaman

A microscope for computational imaging may include an illumination source configured to illuminate a sample with a plurality of wavelengths, an image sensor, an objective lens to image the sample onto the image sensor, and a processor operatively coupled to the illumination assembly and the image sensor. The processor may be configured to acquire a first image dataset from the sample illuminated using a first set of illumination conditions at a first wavelength. The processor may also be configured to acquire a second image dataset from the sample illuminated using a second set of illumination conditions having a second number of illumination conditions at a second wavelength. The second set of illumination conditions comprises fewer illumination conditions than the first set in order to decrease acquisition time. The processor may be configured to combine the first and second image datasets into a computationally reconstructed image of the sample.

Compressed acquisition of microscopic images

A microscope system may comprise a plurality of microscope modules, a cassette for holding a plurality of slides, a slide loader configured to move the plurality of slides between the cassette and the plurality of microscope modules, and a processor coupled to the slide loader. The processor may be configured with instructions which, when executed, cause the slide loader to move a slide into or from a selected microscope module among the plurality of microscope modules. Various other methods, systems, and computer-readable media are also disclosed.

Multi/parallel scanner

A microscope including an illumination assembly, an image capture device and a processor can be configured to selectively identify regions of a sample including artifacts or empty space. By selectively identifying regions of the sample that have artifacts or empty space, the amount of time to generate an image of the sample and resources used to generate the image can be decreased substantially while providing high resolution for appropriate regions of the computational image. The processor can be configured to change the imaging process in response to regions of the sample that includes artifacts or empty space. The imaging process may include a higher resolution process to output higher resolution portions of the computational image for sample regions including valid sample material, and a lower resolution process to output lower resolution portions of the computational image for sample regions including valid sample material.

Accelerating digital microscopy scans using empty/dirty area detection

A microscope for computational microscopic layer separation may include an imaging device that includes a lens and an image sensor, an illumination system for illuminating a sample, and an actuator to adjust an axial position of a focal plane with respect to the sample. The microscope may also include a processor operatively coupled to the imaging device and the illumination system. The processor may be configured to measure, using the image sensor and the illumination system, optical aberrations of the imaging device at the axial position, and determine whether to adjust the focal plane with respect to the sample in response to the one or more optical aberrations. Various other systems and methods are also disclosed.

Microscope and method for computational microscopic layer separation

A microscope for adaptive sensing may comprise an illumination assembly, an image capture device configured to collect light from a sample illuminated by the assembly, and a processor. The processor may be configured to execute instructions which cause the microscope to capture, using the image capture device, an initial image set of the sample, identify, in response to the initial image set, an attribute of the sample, determine, in response to identifying the attribute, a three-dimensional (3D) process for sensing the sample, and generate, using the determined 3D process, an output image set comprising more than one focal plane. Various other methods, systems, and computer-readable media are also disclosed.

Adaptive sensing based on depth

Systems and methods are disclosed for focusing a microscope using images acquired under multiple illumination conditions. In one implementation, an autofocus microscope may include an image capture device, a focus actuator, an illumination assembly, and a controller. The controller may cause the illumination assembly to illuminate a sample at a first illumination condition and at a second illumination condition. The controller may acquire a first image of the sample illuminated from the first illumination angle and a second image of the sample illuminated from the second illumination angle. The controller may further determine an amount of shift between image features present in the first image of the sample and a corresponding image features present in the second image of the sample, If the amount of determined shift is non-zero, the focus actuator may change the distance between the sample and the focal plane.

Autofocus system for a computational microscope

Disclosed herein are systems and methods for constructing an image of a sample using a plurality of images acquired under multiple illumination conditions. In some cases, a microscope may include an image capture device, an illumination assembly, and a processor configured to acquire a plurality of images of a sample and a fiducial marker under a plurality of different illumination conditions and to reconstruct a high resolution image in response to the plurality of images. The disclosure also provides a method for generating a high resolution image of a sample comprising acquiring a plurality of images of a sample and a fiducial marker under a plurality of different illumination conditions and reconstructing the high resolution image in response to the plurality of images.

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Yehud, Israel

Eran Small