Intel Corporation

Enrico David Carrieri

Amit Kumar Srivastava

Rajesh Bhaskar

Rolf H Kuehnis

Asad Azam

Myron Loewen

Patrik Eder

Janusz Jurski

Matthew A Schnoor

George Vergis

Mikal Hunsaker

Kenneth Foust

Michael Neve De Mevergnies

Srinivas Patil

Christopher John Haid

Aditya Katragada

Abhijit Jas

Keith A Jones

Neel Piyush Shah

Peter Lisherness

Jonathan Mark Lutz

John W Kitterman

Bhavana Prabhakar

Embodiments of the present disclosure may relate to apparatus, process, or techniques in a I3C protocol environment that include identifying a pending read notification message by a slave device to be sent to a master device to indicate that the data is available to be read by the master device from a buffer associated with the slave device. The pending read notification may be subsequently transmitted to the master device. Subsequently, until the data in the buffer has been read by the master device, the slave device may wait an identified amount of time that is less than a value of a timeout of the master device, and retransmit the pending read notification message to the master device. Other embodiments may be described and/or claimed.

I3C pending read with retransmission

A processor that was manufactured by a manufacturer comprises privileged debug operational circuitry, a debug restriction fuse, a credential store, a credential of the manufacturer in the credential store, and debug control circuitry. The debug restriction fuse is a one-time programmable fuse. The debug control circuitry is to automatically restrict access to the privileged debug operational circuitry, based on the debug restriction fuse. The processor may also include public debug operational circuitry, a prevent-unauthorized-debug (PUD) fuse, and an undo-PUD fuse. When the PUD fuse is set and the undo-PUD fuse is clear, the debug control circuitry may respond to an attempt by a debugger to use the public debug operational circuitry by determining whether the debugger is authorized, disallowing access if the debugger is not authorized, and allowing access if the debugger is authorized. Other embodiments are described and claimed.

Technology for controlling access to processor debug features

An apparatus of a multi-chip package (MCP) of a functional safety system, comprises a processor to be configured as a master chip in a master-slave arrangement with a slave chip in the MCP, and a memory coupled to the processor to store one or more infield test scan patterns. The processor includes a bock to couple the master chip to the slave chip via a high-speed input/output (IO) interface to retrieve the one or more infield test scan patterns from the memory via the master chip, and to provide the one or more infield test scan patterns to the slave chip via the high-speed IO interface in response to the functional safety system entering an infield test mode.

Scalable infield scan coverage for multi-chip module for functional safety mission application

In one embodiment, an apparatus includes: a peer-to-peer (P2P) control circuit to issue a P2P communication request to a bus master of a multi-drop interconnect to request authorization to send a P2P transaction to at least one slave device coupled to the multi-drop interconnect; a transmitter to transmit the P2P transaction to the at least one slave device when the bus master grants the authorization for the P2P transaction; and another transmitter to output the clock signal to the multi-drop interconnect during the P2P transaction. Other embodiments are described and claimed.

System, apparatus and method for peer-to-peer communication on a multi-drop interconnect

A Joint Test Access Group (JTAG) device can include a Joint Test Access Group (JTAG) port, transport layer circuitry to provide a communication to and from a debug device, and packet interpreter circuitry communicatively coupled between the JTAG port and the transport layer circuitry, the packet interpreter circuitry to translate data in a packet from the debug device into a sequence of bits to be provided to the JTAG port.

JTAG scans through packetization

Methods and apparatuses relating to a multiple master capable debug interface are described. In one embodiment, an apparatus includes a device circuit, a wireless connector circuit, and a switching circuit coupled between the device circuit and the wireless connector circuit to switch a debug and test mastership from the wireless connector circuit to a debug and test tool, wirelessly connected to the wireless connector circuit, to perform a debug and test operation on the device circuit.

Apparatuses and methods for a multiple master capable debug interface

In one embodiment, a host controller includes: a first credit tracker comprising at least one credit counter to maintain credit information for a first device; and a first credit handler to send a command code having a first predetermined value to indicate a credit request to request credit information from the first device, where the first credit tracker is to update the at least one credit counter based on receipt of an in-band interrupt from the first device having the credit information. Other embodiments are described and claimed.

System, apparatus and method for hardware-based bi-directional communication via reliable high performance half-duplex link

An apparatus of a multi-chip package (MCP) of a functional safety system, comprises a processor configurable as a master chip in a master-slave arrangement with a slave chip in the MCP, and a memory coupled to the processor to store one or more infield test scan patterns. The processor includes a block to couple the master chip to the slave chip via a high-speed input/output (IO) interface to retrieve the one or more infield test scan patterns from the memory via the master chip, and to provide the one or more infield test scan patterns to the slave chip via the high-speed TO interface in response to the functional safety system entering an infield test mode.

One embodiment provides a master device in a bus system. The master device includes bus interface circuitry to exchange commands and data with a slave device in communication with the master device; and test sequence generation logic to generate at least one test sequence, each test sequence having a corresponding unique clock signal having a unique clock frequency; the test sequence generation logic also to transmit the at least one test sequence and the corresponding unique clock signal to the slave device; the test signal generation logic also to determine, based on feedback from the slave device, if the slave device is capable of communicating with the master device using the unique clock frequency.

Device throughput optimization for bus protocols

Methods and apparatuses relating to a multiple master capable debug interface are described. In one embodiment, an apparatus includes a device circuit, a debug and test access port to debug and test the device circuit, and a switching circuit to switch a debug and test mastership between the debug and test access port and a data access port to the device circuit that is not dedicated to debug and test.

A Test Access Mechanism (TAM) architecture for facilitating testing of IP blocks integrated on a System on a Chip (SoC). The TAM architecture includes a Test Controller and one or more Test Wrappers that are integrated on the SoC proximate to IP blocks. Test data and commands corresponding to input from an external tester are packaged by the Test Controller and sent to the Test Wrappers via an interconnect fabric. The Test Wrappers employ interface with one or more test ports to provide test data, control, and/or stimulus signals to the IP block to facilitate circuit-level testing of the IP block. Test results for the circuit-level tests are returned to the Test Controller via the fabric. Test Wrappers may be configured to pass through interconnect signals, enabling functional testing of IP blocks to be facilitated via test packages and test results transmitted between the Test Controller and the IP blocks via the fabric. The TAM may be implemented in a fabric-to-fabric bridge, enabling testing of IP blocks connected to fabrics on both sides of the bridge.

Functional fabric-based test controller for functional and structural test and debug

A non-volatile memory array such as a flash memory array may include a power savings circuit to control a stand-by mode of the non-volatile memory array. The power savings circuit may cause a placement of the non-volatile memory array into a stand-by mode in the absence of activity on at least one or more inputs of the non-volatile memory array. Power may be saved automatically without processor intervention by reducing the operating current of the non-volatile memory array. The automatic power savings circuit may provide a chip enable output to an input of stand-by circuitry to control the operation of the standby circuitry without requiring an explicit stand-by command from a processor.

Growing community of inventors

Placerville, CA, United States of America

Enrico David Carrieri