National Technology & Engineering Solutions of Sandia, LLC

Purdue Research Foundation

Sandia Corporation

Enrico C Quintana

Steven Forrest Son

Kyle Thompson

Walter L Gill

David G Moore

Richard W Poland

Jack D Heister

Phillip L Reu

Elizabeth M C Jones

Kathryn N Gabet Hoffmeister

George K Hodges

Timothy J Miller

James E Prindville

Eric R Westphal

Daniel Peter Rohe

John P Ellegood

Bryan Lee Witt

A method of X-ray digital image correlation is provided. The method comprises aligning cameras of an X-ray imaging system, wherein the X-ray imaging system comprises two X-ray sources pointed at a target area at a stereo angle and two corresponding X-ray detectors behind the target area. The X-ray imaging system is tuned to determine power levels of the X-ray sources that maximize image contrast and signal-to-noise ratio. The system is calibrated to determine intrinsic and extrinsic stereoscopic imaging parameters. A specimen with a random contrast pattern comprising an X-ray attenuating material is placed in the target area. Stereoscopic X-ray images are taken of the specimen and processed according to the power levels of the X-ray sources to maximize image contrast and signal-to-noise ratio and remove background objects. Kinematic quantities are determined according to changes in the contrast pattern over a number of successive images.

X-ray digital image correlation

A method and system for determining temperature are provided. The method comprises using an x-ray source to irradiate a sample of a material with x-rays. Photon fluorescence produced by the sample in response to the x-ray irradiation is detected by a number of photon detectors. Based on the detected fluorescence a temperature of the sample is determined according to a predetermined relationship between photon fluorescence and temperature for the material.

Temperature dependent x-ray fluorescence

An X-ray contrast sensitivity gauge is described herein. The contrast sensitivity gauge comprises a plurality of steps of varying thicknesses. Each step in the gauge includes a plurality of recesses of differing depths, wherein the depths are a function of the thickness of their respective step. An X-ray image of the gauge is analyzed to determine a contrast-to-noise ratio of a detector employed to generate the image.

Multi-step contrast sensitivity gauge

Growing community of inventors

Albuquerque, NM, United States of America

Enrico C Quintana