Alstom

Alstom Transport Sa

Mitsubishi Denki Kabushiki Kaisha

Emmanuel Dutarde

Pierre Solomalala

Jose Saiz

Benoit Boursat

Kiyoshi Arai

Fabrice Breit

Philippe Lasserre

Makoto Kondou

Nathalie Martin

Christophe Beuille

Henri Schneider

Jos&eacute; Saiz

Thierry Lebey

Jacques Cettour-Rose

Guillaume Lourdel

Beno&icirc;t Boursat

Jean-Marc Dienot

Sorin Dinculescu

This system for measuring an electromagnetic field radiated by an electrical component of an electronic circuit, the electrical component being fixed to a dielectric substrate of the electronic circuit, is wherein a transducer (to) is etched on the substrate of the electronic circuit.

System for measuring an electromagnetic field, a control system using the measuring system, and an electronic circuit designed for the measuring system

The present invention relates to a power semiconductor device comprising a switching power semiconductor element, and a free wheeling diode in anti-parallel connection to the switching power semiconductor element. The power semiconductor is characterized in that a reverse electrode of the switching power semiconductor element and a reverse electrode of the free wheeling diode are bonded and mounted on a circuit pattern formed on the main surface of the first substrate, and that a circuit pattern, which is so formed on the main surface of the second substrate as to oppose a surface electrode of the switching power semiconductor element and a surface electrode of the free wheeling diode, is connected to the surface electrodes of the switching power semiconductor element and the free wheeling diode through connective conductors to be soldered, respectively.

Power semiconductor device

One of the aspects of the present invention is to provide a power semiconductor device, including a first substrate having a first circuit pattern formed thereon, and a second substrate having a second circuit pattern formed thereon. The first substrate has a first center line extending along a predetermined transverse direction. At least one power semiconductor chip is mounted on the first circuit pattern of the first substrate, and has at least one chip electrode opposing to the second circuit pattern of the second substrate. Also, a plurality of first conductive connectors on the first circuit pattern is provided for electrical connection with the second circuit pattern of the second substrate. The first conductive connectors are arranged symmetrically in relative to the first center line of the first substrate.

Arrangement of conductive connectors in a power semiconductor device

A matrix converter for transforming electrical energy between at least one voltage source, in particular a power supply network, and at least one current source, in particular a load, said converter including a matrix of switches connecting said voltage sources to said current sources, wherein each of said switches has two terminals which are interconnected via a photoconductive layer of diamond, each switch being controlled by means of a light source irradiating the layer of diamond interposed between the two terminals of the switch.

Matrix converter for transforming electrical energy

A power switching module is provided having at least one power switch placed above at least one other power switch, each power switch in turn including an upper wall and a lower wall, each of which is cooled through thermal conduction by a cooling medium that circulates in channels and voids that are provided along the walls for this purpose.

Power switching module and inverter equipped therewith

A method of testing a power module including a control gate, an emitter, a collector, at least one power component on a dielectric substrate and a diode connected in antiparallel with the power component measures partial discharges occurring between the emitter and the collector when an alternating current voltage source superimposed on a direct current voltage source is connected between the collector and the emitter of the power module. The voltage V received by the power module between the collector and the emitter verifies at all times the condition V >0 so that the diode never conducts. The power component is maintained in a turned off state during the test by a direct current voltage source connected between the control gate and the emitter.

Method and a device for testing a power module

A matrix converter for transforming electrical energy between at least one voltage source, in particular a power supply network, and at least one current source, in particular a load, said converter including a matrix of switches connecting said voltage sources to said current sources, wherein each of said switches has two terminals disposed in respective distinct parallel planes and a photoconductive diamond substrate interposed between said two terminals of the switch, each switch being controlled by means of a light source irradiating the diamond substrate interposed between the two terminals.

An electronic power circuit substrate including a wafer of electrically insulating material, wherein said wafer presents a face supporting one or more conductive tracks directly connected to one or more electronic power components, said conductive tracks being obtained by fine metallization of said face to a thickness that is less than 150 &mgr;m.

Growing community of inventors

Laloubere, France

Emmanuel Dutarde