Seagate Technology Incorporated

Emil John C Esmenda

Xiaoding Ma

Florin Zavaliche

Huan H Tang

Paul Max Jones

Zhaohui Fan

Fujian Huang

XiaoPing Yan

Michael Joseph Stirniman

Jan-Ulrich Thiele

Timothy John Klemmer

Martin Giles Blaber

Yang Yang

Ruoxi Yang

Koji Adachi

Bing Zhang

Xinwei Li

Hongbo Wang

Emir R Kazazic

Kyoumarss Damavandi

Anand Venkatesh Sethuraman

Qui Tan

Ray Lilly

Connor James Freeman

A method includes forming, by a laser beam supplied by a laser cutting system, a laser-cut line in each of a plurality of glass samples. Each different laser-cut line in each different glass sample of the plurality of glass samples is formed when the laser cutting system is at a different process setting. The method also includes subjecting each of the plurality of glass samples with the laser-cut lines to a break test, and obtaining a plurality of break strength values. Each different break strength value of the plurality of break strength values is indicative of a laser-cut line quality of the respective glass sample of the plurality of glass samples.

Break strength method for testing glass laser cut quality of disc substrates using break testing apparatus

Provided herein is an apparatus including a head over-coat and a depleted region in the head over-coat. A media over-coat is deposited in the depleted region. A near field transducer is adjacent to the head over-coat, wherein the near field transducer combusts the deposited media over-coat.

Selective heat-assisted removal of head over-coat and media over-coat

Provided herein is an apparatus including a substrate and a magnetic recording layer over the substrate. In addition, a thermochromic layer is over the substrate, wherein the thermochromic layer includes a first optical absorbance at a first temperature and a second optical absorbance at a second temperature.

Apparatuses and methods for absorbing optical energy

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Pleasanton, CA, United States of America

Emil John C Esmenda