Siemens Aktiengesellschaft

Gsi Helmholtzzentrum Fur Schwerionenforschung Gmbh

Elke Rietzel

Alexander Gemmel

Christoph Bert

Nami Saito

The invention concerns a device for determining control parameters for an irradiation system by means of which a number of irradiation doses are successively deposited at different target points in a target volume. The device comprises an input device which is designed for detecting a target region and for detecting a movement of the target region, an evaluation device for detecting control parameters for controlling a beam in such a way that with the help of the control parameters a beam is able to follow the movement of the target region and to deposit a defined dose distribution in the target region, wherein the evaluation device is designed in such a way that when detecting the control parameters at least a first selectable control parameter is detected so that the beam is able to follow the movement of the target region merely orthogonally to beam direction, or when detecting the control parameters, at least a first selectable control parameter and a further control parameter representing energy modulation are detected, wherein the determination of the at least first control parameter and the further control parameter is performed by considering motion tracking in beam direction.

Growing community of inventors

Weiterstadt, Germany

Elke Rietzel