Texas Instruments Corporation

Elida de-Obaldia

Robert Bogdan Staszewski

Dirk Leipold

A system and method for low-cost performance and compliance testing of local oscillators and transmitters for wireless RF applications. A preferred embodiment comprises observing a digital signal from within an RF circuit, manipulating the signal with digital signal processing techniques, and determining if the RF circuit passes a test based upon results from the manipulating. Since the signal is clocked at a much lower frequency than an RF output of the RF circuit and the manipulation is performed digitally, testing can be performed at different stages of the production cycle and expensive test equipment can be eliminated.

Growing community of inventors

Dallas, TX, United States of America

Elida de-Obaldia