International Business Machines Corporation

Elena Tsanko

Anatoly Koyfman

Vitali Sokhin

Allon Adir

Amir Nahir

Tom Kolan

Yoav Avraham Katz

Olaf Knute Hendrickson

Ronny Morad

John Martin Ludden

Shady Copty

Eyal Bin

Wesam Saleem Ibraheem

Shimon Landa

Anatoli Andreev

Richard D Peterson

Techniques for modifying a circuit are described herein. In some examples, a method includes generating a set of testing data and detecting a predetermined modification to a translation path corresponding to a memory address mapping, the predetermined modification to change a physical memory address of the testing data associated with a virtual memory address to a second physical memory address of the testing data. The method can also include generating a test template comprising a first instruction to implement the predetermined modification and a second instruction comprising the second physical memory address in the translation path and transmitting the test template to the circuit for each of a plurality of software instruction threads. Furthermore, the method can include detecting a defect in the execution of the test template by the circuit and modifying the circuit to prevent the defect during execution of the test template.

Circuit modification

An apparatus and a computer-implemented method performed by a computerized device, comprising: generating a collection of test data for testing one or more domains, wherein the test data is useful for post-silicon verification of hardware devices; selecting a subset of the collection of test data in accordance with a hardware device to be tested and at least one of the domains to be tested with respect to the hardware device; and indexing the subset of the collection of test data to obtain an indexed collection.

Method and apparatus for post-silicon testing

A computer-implemented method, system and computer program product are presented for managing an Effective-to-Real Address Table (ERAT) and a Translation Lookaside Buffer (TLB) during test verification in a simulated densely threaded Network On a Chip (NOC). The ERAT and TLB are stripped out of the computer simulation before executing a test program. When the test program experiences an inevitable ERAT-miss and/or TLB-miss, an interrupt handler walks a page table until the requisite page for re-populating the ERAT and TLB is located.

Software table walk during test verification of a simulated densely threaded network on a chip

Device, system and method of verification of address translation mechanisms. For example, an apparatus for testing an address translation mechanism of a design-under-test, the apparatus including: a test generator to receive a specification of at least one address translation table, and to generate one or more constraint-satisfaction-problem projectors over a plurality of attributes of said address translation table.

Method of verification of address translation mechanisms

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Haifa, Israel

Elena Tsanko