Raytheon Company

Elaine Ellen Seasly

Michael Kennedy Burkland

David Brooke Hatfield

Zachariah A Seasly

Mickael Kennedy Burkland

The disclosed system, device and method for automated non-contact cleaning of hardware articles generally includes: a cleaning chamber configured to at least partially enclose the hardware article to be cleaned; a plurality of nozzles configured to spray a sublimating agent on the hardware article; an air inlet configured to purge the chamber with a gas; and an air outlet configured to exhaust the purge gas, contaminants and sublimating agent from the chamber. Disclosed features and specifications may be variously controlled, adapted or otherwise optionally modified to realize improved non-contact cleaning function.

Automated non-contact cleaning

A system and method for modeling the effect of a molecular contaminant film on performance of an optical system is disclosed. A mass of material outgassed from materials of the optical system is correlated to spectrum of outgassed products. The spectrum of outgassed products is normalized, and an aggregate molecular contaminant film thickness is predicted from each material. The absorbance spectrum of the aggregate molecular contaminant film is derived, and the derived absorbance spectrum of the aggregate contaminant film is convolved with an optical system instrument function. A plot of at least one transmission band as a function of source temperature is performed to determine the degradation in performance of the optical system.

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Tucson, AZ, United States of America

Elaine Ellen Seasly