Other

Ekkehard Ueberreiter

Josef Gentischer

The invention relates to an apparatus for testing electronic components, in particular IC's, having a transporting device to which holders for the components are detachably attached by fastening devices, and which is passed through a loading station to receive the components, a testing station to test the components and an unloading station to remove the components. To generally improve the functional efficiency of the apparatus and to carry out in particular the loading and unloading procedure with less danger of damaging the components, it is proposed according to the invention to provide that the holder, together with the components, can be attached to the transporting device in the loading station and be removed therefrom in the unloading station.

Apparatus for testing electronic components having a loading station a

To reduce manual work by an operator filling and unloading a device for testing and sorting electronic components it is suggested that a cassette carriage carrier (8) with a cassette carriage (10) displaceable therein, be placed in front of the input magazine (2). The cassette carriage (10) carries a cassette (11), on which a large number of magazine rods (12) are arranged side by side. The magazine rods (12) are displaceable and arranged on a plane which extends perpendicularly to the plane of the magazine channels of the input magazine (2) of the device (1). In the same way there can be provision for a cassette carriage carrier (8a) with a cassette (10a) and a cassette (11a) as well as the magazine rods (12a) attached to it in connection with the output magazine (6) of the device (1).

Device for testing and sorting electronic components

In a device for conveying components contained in an input magazine, particularly integrated chips, to an output magazine (3), which is connected to the input magazine by means of a testing device, individual component receiving portions (34) of the output magazine (3) are provided with storage and indicating devices (52), each of which store and indicate information corresponding to a component testing and measuring class. The components are supplied to the receiving portions (34) of the output magazine (3), on the basis of the data stored in the individual storage and indicating devices (52), so that a component determined by the testing device as belonging to a certain component test and measuring class is conveyed to the receiving portions (34) associated with this class, and in the absence of such a receiving portion is conveyed to a receiving portion which is still free, which is then marked as belonging to the test and measuring class in question.

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Munich, Georgia

Ekkehard Ueberreiter