Nidek Co., Ltd.

Eiji Yonezawa

Yasuo Tano

Hirokazu Sakaguchi

Kenzo Shodo

Takayasu Yamamoto

Taizo Umezaki

Kojiro Tano, Legal Representative

Sayaka Nakajima, Legal Representative

Hiroyuki Kanda

Tadashi Aoyama

Ryoko Tano, Legal Representative

Ryotaro Tano, Legal Representative

A living tissue stimulation circuit includes: an H-bridged circuit that includes a first series section in which a first semiconductor switch connected to a power source side and a third semiconductor switch connected to a ground side are connected to each other in series, and a second series section in which a second semiconductor switch connected to the power source side and a fourth semiconductor switch connected to the ground side are connected to each other in series, the first series section and the second series section being connected to each other in parallel; a stimulation electrode connected to a first node between the first and third semiconductor switches; a counter electrode connected to a second node between the second and fourth semiconductor switches; and a current adjusting circuit configured to determine a current value output from the stimulation electrode.

Living tissue stimulation circuit

A sight regeneration assisting device for regenerating the sight of a patient comprises a plurality of needlelike electrodes each having a pointed distal end and being to be inserted in an optic papilla of a patient's eye in use; and a signal generator connected with the electrodes through a conductive wire to generate an electric stimulus pulse signal to be outputted from the electrodes, each of the electrodes, excepting a predetermined portion including the distal end, being coated with a coating layer made of resin exhibiting good biocompatibility and insulation, and the coating layer being formed with a turn-back retaining portion for retaining the electrode.

Sight regeneration assisting device

Provided is a vision regeneration assisting apparatus including a plurality of electrodes which are placed in a human body to apply an electrostimulation pulse signal to a cell for forming a retina; and a controller which outputs the electrostimulation pulse signal having bipolarity from the electrodes, wherein the controller comprises a capacitor which accumulates a current used for the electrostimulation pulse signal and converts the current into a voltage; a voltage detecting circuit which detects the voltage of a capacitor; and a switching circuit which allows the current to flow in the electrodes until the voltage of the capacitor reaches a predetermined voltage and allows the current having polarity opposite to (the polarity of the current which flows until the voltage of the capacitor reaches the predetermined voltage) until the voltage of the capacitor is substantially reset to 0.

Vision regeneration assisting apparatus

A vision regeneration assisting device for regenerating vision of a patient, comprising: a plurality of electrodes which are stuck and placed into an optic disc of the patient; a storage unit which stores a generation position of a phosphene specific to the patient in association with the first output conditions for the stimulation signal that has caused to generate the phosphene, the storage unit storing various first output conditions for the stimulation signals and the generation positions of the phosphenes caused by the stimulation signals based on the various first output conditions in association with each other; a processor which sets second output conditions for the stimulation signal based on image data obtained by an external photography unit and the generation positions of the phosphenes stored in the storage unit, and converts the obtained image data into data for the stimulation signal based on the set second output conditions.

Vision regeneration assisting device

A defect inspection apparatus for inspecting an object to be inspected for a defect by processing an image taken from the object, includes: neural networks provided respectively for individual defect types to be classified; a learning unit which makes the neural networks learn based on the corresponding defect types to be classified; and a defect detection unit which classifies and detects defect types using the neural networks that have learned.

Defect inspection apparatus

An inspection apparatus for inspecting a resist boundary on a substrate having an outer surrounding portion, includes: an illumination unit which illuminates the outer surrounding portion of the substrate; a detector which detects light reflected from the outer surrounding portion; and a judgment unit which judges, based on light intensity of the detected reflected light, whether a resist removal width is proper.

Inspection apparatus for inspecting resist removal width

A defect inspection method of inspecting a defect of an inspection object having a chip pattern, the defect inspection method comprising the steps of: inputting a captured first image of the inspection object; obtaining a second image having a predetermined size based on one of a chip size and a size of exposure shot from the inputted first image; determining an averaged luminance of the obtained second image; and detecting the defect based on the determined averaged luminance and a predetermined inspection condition.

Defect inspection method and defect inspection apparatus

In a visual inspection apparatus for visual inspection of an object, a plurality of monochrome images obtained from an object are used to prepare a plurality of computed color images. The computed color images are switchingly displayed on a color display for visual inspection.

Visual inspection apparatus

A pattern inspecting apparatus includes an illuminating optical system for illuminating a pattern in a region subject to inspection on a workpiece from a substantially perpendicular direction; a detecting optical system for detecting regularly reflected light or transmitted light from the pattern illuminated by the illuminating optical system, the detecting optical system having a numerical aperture which does not allow the structure of the pattern in the region subject to inspection to be optically resolved; a wavelength-varying system for selectively rendering variable the wavelength of the light detected by the detecting optical system; and a measuring system for measuring the structure of the pattern on the basis of light intensity information of the detected light in correspondence with the wavelength varied by the wavelength-varying system.

Pattern inspection apparatus

A defect inspecting apparatus for inspecting a defect of an object having a periodic pattern includes: a dark field illumination optical system that illuminates the object with substantially parallel illumination light in a direction having a predetermined first inclined angle relative to an inspection surface of the object; an imaging optical system having an imaging element for imaging the object illuminated with the illumination light, the imaging element having an imaging lens; and a defect detecting system for detecting the defect based on image data of the object thus imaged. A mutual positional relation ship between the direction of illumination by the illumination optical system and a direction of imaging by the imaging optical system is determined based on a diffraction angle defined by a period of the pattern and a wavelength of the illumination light. A sum of an aperture angle of the illumination light and an object side aperture angle of the imaging lens is set to be smaller than the diffraction angle.

Defect inspecting apparatus

A defect inspection apparatus for inspecting a presence of a defect on an object includes: a first input unit which inputs wavelength characteristics of each of a plurality of samples with wavelength variation of an illumination light for inspection; a second input unit which inputs inspection conditions which an inspector sets for each of the samples as a teaching signal; a third input unit which inputs a wavelength characteristic of the object with the wavelength variation of the illumination light; a neural network which learns and stores a relationship between the inputted wavelength characteristic of each sample and the inputted inspection condition for each sample, and determines an inspection condition for the object based on the inputted wavelength characteristic of the object and the learned relationship; and a defect detector which detects a defect of the object based on the determined inspection condition of the object.

A defect inspecting apparatus for inspecting a defect on an object to be inspected on the basis of comparison between a pattern at a first position and a pattern at a second position on the object to be inspected having repeated patterns. The apparatus includes: an imaging optical system having an image pick-up element for picking up an image of a substantially entire region or a divided region of the surface of the object to be inspected; a moving system for relatively moving the imaging optical system with respect to the object to be inspected; a movement controlling system for controlling the moving system such that a positional relationship of the pattern at the first position with respect to pixels of the image pick-up element is made substantially identical to a positional relationship of the pattern at the second position after movement thereof with respect to the pixels of the image pick-up element; and a defect detecting system for detecting a defect on the basis of comparison of data on two images picked up by the image pick-up element before and after the movement.

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Aichi, Japan

Eiji Yonezawa