Olympus Corporation

Eiji Yokoi

Kenichi Kusaka

Masayoshi Saito

Hiroshi Sasaki

Yoshihiro Shimada

Tatsuo Nakata

Yoshinori Iketaki

Naoki Hayashi

Makio Ueno

Shingo Tamano

Shuhei Horigome

Noriyuki Sugizaki

A nonlinear optical microscope apparatus includes: an objective for irradiating a laser beam on a sample; a beam diameter change unit for changing a beam diameter of the laser beam incident to the objective; and a control unit for deciding, for each of optical characteristics of the sample, a pupil filling ratio, which is a ratio of the beam diameter of the laser beam incident to the objective to a pupil diameter of the objective, based on the optical characteristics of the sample, and for controlling the beam diameter change unit so that the pupil filling ratio becomes the decided value.

Nonlinear optical microscope apparatus

A scanning optical microscope includes a light source, a light converging optical system, a stage, a scanning unit which displaces an illumination light and the stage relatively, a detecting optical system, and a photodetector. A light modulation element and a relay optical system are disposed on the light converging optical system side of the light source, and a modulated signal having only amplitude changed is input to the light modulation element, and the light modulation element is positioned such that the illumination light emerged from the light modulation element with respect to the modulated signal of a predetermined amplitude coincides with an optical axis of the light converging optical system, and a position of a pupil of the light converging optical system and a position of the light modulation element are conjugate through at least the relay optical system.

Scanning optical microscope

A laser microscope comprises a laser light source emitting illumination light; an objective applying the illumination light on a sample; a light path compounding unit compounding a first illumination light path and a second illumination path between the laser light source and the objective; a phase-modulation type spatial light modulator placed on a position on the first illumination path, the position also being optically conjugate with a pupil position of the objective, modulating a phase of the illumination light; and a two-dimensional scanning unit placed on the second illumination light path, scanning the sample in a plane orthogonal to an optical axis of the objective.

Laser microscope using phase-modulation type spatial light modulator

A microscope system that performs structured illumination includes a light source configured to emit illumination light, an objective lens that irradiates a specimen with the illumination light, a phase-modulation spatial light modulator that has a two-dimensional pixel structure, that is arranged at the pupil conjugate position of the objective lens on an illumination light path between the light source and the objective lens, and that is configured to modulate a phase of the illumination light for each pixel so as to form a fringe illumination pattern on the specimen on the basis of an optical parameter of at least one of the light source and the objective lens.

Microscope system

A microscope apparatus includes a laser beam source for emitting a laser beam, an objective lens for irradiating a sample with the laser beam, a phase-modulating spatial light modulator placed between the laser beam source and the objective lens at a position optically conjugate with a pupil position of the objective lens, and a beam diameter variable unit placed between the laser beam source and the phase-modulating spatial light modulator for varying a beam diameter of the laser beam incident to the phase-modulating spatial light modulator.

Microscope apparatus

An immersion microscope objective formed of thirteen or fewer lens elements includes, in order from the object side, first and second lens groups of positive refractive power, a third lens group, a fourth lens group having negative refractive power with its image-side surface being concave, and a fifth lens group having positive refractive power with its object-side surface being concave. The first lens group includes, in order from the object side, a lens component that consists of a lens element of positive refractive power (when computed as being in air) and a meniscus lens element having its concave surface on the object side. Various conditions are satisfied to ensure that images of fluorescence, obtained when the immersion microscope objective is used in a laser scanning microscope that employs multiphoton excitation to observe a specimen, are bright and of high resolution. Various laser scanning microscopes are also disclosed.

Laser scanning microscope system

The present invention provides an optical microscope capable of suppressing unnecessary response light as a background and detecting desired response light in nonlinear optical response process with a good S/N ratio. The optical microscope for collecting, on a sample, stimulation light emitted from a stimulation light sourceand having a single wavelength or a plurality of different wavelengths, and detecting response light emitted from the samplein nonlinear optical response process, comprises: an erase light sourcefor emitting erase light having a wavelength different from that of the stimulation light and inducing an effect of suppressing secondary response light which appears due to irradiation of the stimulation light on the sample, wherein the erase light and the stimulation light are simultaneously irradiated on the samplesuch that the erase light does not suppress response light emitted from a light-collecting area of the stimulation light but suppresses the secondary response light other than the response light emitted from a light-collecting area of the stimulation light.

Optical microscope configured to simultaneously irradiate the erase light and the stimulation light

A detecting device includes a wavelength dispersion element for dispersing light into wavelengths and for emitting dispersed light, a photodetector for detecting the dispersed light, and a wavelength restriction element, which is arranged between the wavelength dispersion element and the photodetector and has an optical characteristic dependent on a wavelength, for restricting an incidence of light having a particular wavelength to the photodetector. Light that is part of the dispersed light and includes the light having has the particular wavelength is incident to the wavelength restriction element.

Detecting device and optical apparatus including the detecting device

A laser scanning microscope is disclosed that combines light from first and second scanning optical systems onto a common optical path using a beam combiner. A first plane-parallel transparent plate and a beam combiner are positioned on a support that may be moved relative to the common optical path. The first plane-parallel transparent plate has an optical thickness equal to the optical thickness of the beam combiner and is oriented with its surface normal lying substantially parallel with the surface normal of the beam combiner. An astigmatism-correcting optical element is provided on the common optical path, with the astigmatism-correcting optical element generating astigmatism that is equal in magnitude, but different in direction by 90 degrees, to the astigmatism generated by non-collimated light that is transmitted through the beam combiner. When the support is repositioned, spherical aberration in various light paths is maintained constant so that it may be easily corrected.

Laser combining mechanism for use in a laser scanning microscope, and a laser scanning microscope that uses it

In a laser scanning microscope comprising an infrared pulse laser; an objective lens focusing an infrared light from the infrared pulse laser on a sample; a condenser lens disposed on an opposite side of the objective lens across the sample for collecting an observation light that is generated by a nonlinear optical effect and has a wavelength shorter than a wavelength of the infrared light; a visible light detector detecting the observation light collected by the condenser lens, an IR partial transmission filter having partially-modified transmission characteristics for the infrared light is disposed near a front focal position of the condenser lens, and an infrared light detector detecting, through the IR partial transmission filter, a transmitted light from the sample collected by the condenser lens, is provided.

Laser scanning microscope having an IR partial transmission filter for realizing oblique illumination

Immersion microscope objective and laser scanning microscope system using same

The invention provides a confocal microscope comprising a light source; a light scanning unit; an array device; a line-beam generating unit for imaging illumination light in the form of a straight line extending, on the array device, in a direction intersecting the scanning direction of the light scanning unit; an objective lens for imaging the illumination light reflected or transmitted at the array device on a specimen; a beamsplitter, between the array device and the light scanning unit, for splitting off from the illumination light detection light from the specimen; a two-dimensional image-acquisition unit for acquiring the split off detection light; and a control unit for controlling the light scanning unit and the array device, wherein the array device is disposed in an optically conjugate positional relationship with a focal plane of the objective lens, and the control unit performs control so as to synchronize the light scanning unit and the array device.

Growing community of inventors

Tokyo, Japan

Eiji Yokoi