Nidec Corporation

Wacoal Corporation

Rigaku Industrial Corporation

Eiji Yamada

Tadashi Utaka

Nobuo Ohtsuki

Aiko Fuyuki

Taizou Kishimoto

A brassiere size determination apparatus for clothing with cups covering a user's bust includes an acquisition unit and a determination unit. The acquisition unit acquires a first volume of at least a lower part of the bust. The determination unit determines a cup size of clothing with cups based on the first volume of the lower part.

Size determination apparatus and size determination method for clothing with cups

Accuracy of detecting abnormalities on the surface of a workpiece is improved. An appearance inspection apparatus for inspecting the appearance of a workpiece is provided. The appearance inspection apparatus for inspecting the appearance of the workpiece includes a first lighting unit that irradiates the workpiece with light, a first imaging unit that images the workpiece irradiated by the first lighting unit, a first detection unit that detects a first defect from an image captured by the first imaging unit, a second lighting unit that irradiates the workpiece with light, a second imaging unit that images the workpiece irradiated by the second lighting unit, and a second detection unit that detects a second defect from an image captured by the second imaging unit. The first lighting unit uses coaxial epi-illumination, and the second lighting unit uses coaxial epi-illumination and dome illumination.

Appearance inspection apparatus and appearance inspection method

An X-ray Spectroscope comprising a pair of soller slits disposed such that one end of each faces an X-ray emitting portion of a sample, a pair of total reflection mirrors disposed such that one end of each face the other end of the respective soller slits and that the reflecting surfaces thereof face each other and make a predetermined angle with respect to X-rays passed through the respective soller slits and an X-ray detector disposed at a position, at which X-rays reflected by the total reflection mirrors intersect each other. If necessary, it further provides a pair of auxiliary soller slits between the X-ray detector and the total reflection mirrors and a filter capable of absorbing only characteristic X-rays from a particular substance. Such an X-ray spectroscope has an extremely improved efficiency of detection compared to the conventional spectroscope of this kind and can also permit size reduction of the entire device.

Growing community of inventors

Kyoto, Japan

Eiji Yamada