Fujitsu Corporation

Eiji Sugiyama

Toshiharu Saito

Mitsuaki Natsume

Yasunori Kanai

Hiroyuki Tsunoi

Motohiro Seto

Kazumasa Nawata

Naoyuki Ando

A semiconductor integrated circuit device has a dual configuration involving a first latch circuit and a second latch circuit that are connected in parallel with each other. The first latch circuit is provided with an input terminal to operate the first latch circuit independently of the second latch circuit. This semiconductor integrated circuit device is capable of individually testing the latch circuits of the dual configuration, to ensure the merit of the dual configuration.

Semiconductor integrated circuit device of dual configuration having

Semiconductor integrated circuuit device of dual configuration having

A semiconductor integrated-circuit apparatus includes an electro-conductive layer formed on a substrate, a plurality of internal cells formed on the electro-conductive layer, a plurality of bonding pads arranged around the internal cells, and a plurality of bias cells which are common to the plurality of internal cells and which generate a predetermined voltage. A plurality of bias buffer circuits supply the predetermined voltage generated in the bias cells to the internal cells.

Semiconductor integrated-circuit apparatus with internal and external

Semiconductor integrated circuit apparatus

A semiconductor integrated-circuit apparatus includes a electro-conductive layer formed on a substrate, a plurality of internal cells formed on the electro-conductive layer, a plurality of bonding pads arranged around the internal cells, and a plurality of bias cells which are common to the plurality of internal cells and which generate a predetermined voltage. A plurality of bias buffer circuits supply the predetermined voltage generated in the bias cells to the internal cells.

Semiconductor integrated-circuit apparatus

A latch circuit has two complementary hold loops therein for improving noise tolerance. The latch circuit includes a first gate for receiving a data and a first clock signal and outputting a first signal in response to a change in the clock signal. A second gate receives a second clock signal having an inverted polarity to that of the first clock signal. A third gate is operatively connected to output terminals of the first and second gates and outputs a first latch output. The latch circuit also includes a first hold line which supplies the first latch output to the second gate and a second hold line which supplies a second latch output of the latch circuit having an inverted polarity to that of the first latch output to the second gate. The second gate may have an inverted input terminal receiving the second latch output.

Latch circuit having two hold loops

In a master-slave type flip-flop circuit including a normal function in a normal mode for flip/flop operation and a scanning function in a scanning mode for testing an integrated circuit, the master-slave type flip-flop circuit comprises: a master stage having a first pair of differential transistors for taking in data, a second pair of differential transistors for latching data taken in to the first pair of differential transistors, a third pair of differential transistors for taking in scanning data, and a fourth pair of differential transistors for activating the second and third pair of differential transistors in the scanning mode; and a slave stage having a first pair of differential transistors for taking in data from the master stage, a second pair of differential transistors for latching data taken in to the first pair of differential transistors, a third pair of differential transistors for latching scanning data, and a fourth pair of differential transistors for activating the first and third pair of differential transistors in the scanning mode.

Master-slave type flip-flop circuit

A bias circuit for providing a reference voltage to an output circuit, for example, an ECL circuit in an LSI. The bias circuit is able to operate at a lower power supply voltage of about -2 V and includes a first transistor having an emitter which is connected to a power supply and a base and a collector commonly connected through an impedance circuit to ground. The bias circuit is also connected to the output circuit, whereby heat generation in the LSI is decreased.

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Kawasaki, Japan

Eiji Sugiyama