Hewlett-packard Development Company, L.P.

Indigo N.v.

Applied Materials, Inc.

Hewlett-packard Indigo B.v.

Vieu Labs, Inc.

Ehud Chatow

Nathan McPherson Moroney

Steven J Simske

Benzion Landa

Galia Golodetz

Ishaiau Lior

Andrew E Fitzhugh

Melanie M Gottwals

Amiran Lavon

Kok-Wei Koh

Paul Fenster

John Ludd Recker

Yakov Krumberg

Jakob Karin

Benjamin I Dempster

Justin H Wong

Alysha Naples

Yosef Cohen

Omer Gila

Ronald Albert Askeland

Napoleon J Leoni

Gary Joseph Dispoto

Carl Staelin

Clayton L Holstun

Yaacov Almog

Henry Harlyn Baker

Ron Maurer

Eric Hoarau

William David Holland

Fabio Giannetti

Nina Bhatti

Ingeborg Tastl

I-Jong Lin

Bruce J Jackson

David S Vejtasa

Christian Schmid

Sergio Brandriss

Kay-Yut Chen

Paul F Matheson

Gal Victor

Andrew Bolwell

Yaron Galant

Meghan J Kennedy

Haim Victor Gal

Wafers that begin as flat surfaces during a semiconductor manufacturing process may become warped or bowed as layers and features are added to an underlying substrate. This warpage may be detected between manufacturing processes by rotating the wafer adjacent to a displacement sensor. The displacement sensor may generate displacement data relative to a baseline measurement to identify areas of the wafer that bow up or down. The displacement data may then be mapped to locations on the wafer relative to an alignment feature. This mapping may then be used to adjust parameters in subsequent semiconductor processes, including adjusting how a carrier head on a polishing process holds or applies pressure to the wafer as it is polished. A model may be trained to provide control signals for a polishing/cleaning process, or to generate metrology data.

Displacement measurements in semiconductor wafer processing

Wafers that begin as flat surfaces during a semiconductor manufacturing process may become warped or bowed as layers and features are added to an underlying substrate. This warpage may be detected between manufacturing processes by rotating the wafer adjacent to a displacement sensor. The displacement sensor may generate displacement data relative to a baseline measurement to identify areas of the wafer that bow up or down. The displacement data may then be mapped to locations on the wafer relative to an alignment feature. This mapping may then be used to adjust parameters in subsequent semiconductor processes, including adjusting how a carrier head on a polishing process holds or applies pressure to the wafer as it is polished.

A method of performing a user related operation includes, with an optical reader, reading an encoded on-line address being displayed on a display of a pocket-sized card to be carried by a user; decoding the encoded on-line address; requesting access to remotely stored data using the on-line address, the remotely stored data being related to the user; and, upon the requested access being granted, loading the remotely stored data.

Performing a user related operation

A system may comprise a trigger creation module configured to provide a set of one or more trigger conditions, satisfaction of each trigger condition being based on sensor data to be received. A sensor interface module may be configured to receive actual sensor data from one or more sensors, the actual sensor data being generated contemporaneously with recording of an activity. A trigger satisfaction module may be configured to determine whether at least one trigger condition of the set of trigger conditions has been satisfied based on the actual sensor data. An event identification module may be configured to identify a potentially interesting event within the recording of the activity based on the satisfied at least one trigger condition.

Systems and methods for identifying potentially interesting events in extended recordings

A corrected optical property value of an optical property of interest captured within a digital image is determined. A search query based on the corrected optical property value is determined. A database is searched using the search query to determine search results for the search query that have appearance attributes with optical properties at least similar to the corrected optical property value.

Corrected optical property value-based search query

An identification mark may have a calibration color, a predetermined authentication color, and a predetermined difference between the calibration color and the predetermined authentication color that is associated with a product; and a visual code with a mechanism that identifies the predetermined difference.

Identification mark with a predetermined color difference

A covert label. A substrate comprises a field of ink. Disposed within the field of ink, is ink that can be preferentially removed according to a preconfigured pattern. The preconfigured pattern comprises information associable with at least one object.

Covert label

The present disclosure is directed systems and methods of sorting print jobs for assignment to a plurality of print service providers. In one aspect, such a method can include receiving at a print server a plurality of print jobs having a plurality of print parameters from a plurality of users, where individual print jobs have multiple print parameters being represented in a portion of the plurality of print jobs. The method can further include selecting a prioritization factor, identifying a plurality of print service providers having at least partially different printing configurations, sorting the plurality of print jobs into a plurality of print job groupings based on common printing parameters and the prioritization factor, and sending the plurality of print job groupings to the plurality of print service providers to achieve the common print parameters and the prioritization factor.

System and method of sorting print jobs for a plurality of print service providers

A method comprises receiving a change request input from a user to change one or more parameters of a product in a product visualization; determining at least one available option based on the change request input and manufacturable capabilities; and presenting a modified product visualization to the user based on at least one determined available option.

Product visualization

The present disclosure is directed to method and systems of sorting print jobs for assignment to a plurality of printers having different printing characteristics. Print jobs can be received, sorted based on the print parameters of the print jobs, combined into print job groupings based on printing prioritizations, and sent to a plurality of printers having printing configurations that achieve the print parameters and the printing prioritizations.

System and method of sorting print jobs

A marked target representation () includes a human-cognizable relation mark (). The marked target representation represents a target. An image capture device () is used to capture () an image () of the target representation. A data structure () indicating a relation between a user () of the image capture device and the target is generated () using the image.

Identifying user-target relation

A method for producing a customized print includes determining a color of at least one feature of an object, where the object is imaged with a reference color chart. A color palette is selected based on the at least one determined feature color and a print is generated based on the selected color palette. A system for producing a customized print is also described.

Method and system for creating a customized print

Methods and systems for defining packaging components are provided. An exemplary embodiment provides an expert system () for defining packaging components. The expert system includes a processor () and a memory (). The memory () includes code () configured to direct the processor () to obtain a product definition, obtain lifecycle parameters, and access a database (, or) to identify packaging components that match the lifecycle parameters and product definition.

Method and system for defining packaging components using lifecycle analysis

A soft proof system includes a display module and a manager. The display module displays a visual representation of a print product, and a color array expressing a tolerance range of a color component of the visual representation and a target color within the range. Via the manager, a visualization function produces the visual representation and the color array according to a soft proof array. A tolerance selection function, associated with the display module, enables selection of the tolerance range for at least a portion of the print product, wherein the selection is expressed on the display in the visual representation and in the color array.

Soft proofing system

A designer-adaptive visual code (&#x2033;) includes a user-selected set glyphs ('&#x2212;), a user-selected set of allowable glyph orientations relative to a user-selected reference angle, and a user-selected spatial arrangement of the glyphs (&#x2032;&#x2033;). The user-selected set of glyphs () has a size sufficient to recover geometric characteristics of at least one repeating code portion so as to generate an analyzable image when captured via a camera-equipped mobile device (). The user-selected spatial arrangement of the glyphs (&#x2032;&#x2033;) includes the at least one repeating code portion () to be visible on a surface from at least two different areas of the surface.

Designer-adaptive visual codes

Growing community of inventors

Palo Alto, CA, United States of America

Ehud Chatow