The Boeing Company

Edwin P Walker

Steven Fulton Griffin

Sudhakar Prasad

A system and method are provided for super-resolution imaging beyond the Rayleigh spatial resolution limit of an optical system. In the context of a system, first and second pinhole assemblies are configured to be controllably positioned. The first and second pinhole assemblies define respective pinholes and being configured to be backlit. The system also includes a collimating lens configured to collimate at least a portion of the signals passing through the respective pinholes of the first and second pinhole assemblies. The system further includes an amplitude/phase mask configured to provide amplitude and phase modulation to signals received from the collimating lens and an imaging lens configured to focus the signals received from the amplitude/phase mask upon an image plane to permit objects to be separately identified.

Growing community of inventors

Kihei, HI, United States of America

Edwin P Walker