Advanced Micro Devices Corporation

Edward S Alcid

Seah Sun Too

Eric Tosaya

Raj N Master

Michael Zhouying Su

Lei Fu

David Bruce Morken

Tek Seng Tan

Keng Sang Cha

Leang Hua Kam

Ahmad Juwanda

Diong-Hing Ding

Various semiconductor workpieces and methods of dicing the same are disclosed. In one aspect, a method of manufacturing is provided that includes forming a channel in a metallization structure on a backside of a semiconductor workpiece. The semiconductor workpiece includes a substrate. The channel is in substantial alignment with a dicing street on a front side of the semiconductor chip.

Semiconductor workpiece with backside metallization and methods of dicing the same

Various semiconductor chips and methods of making the same are disclosed. In one aspect, a method of manufacturing is provided that includes providing a semiconductor wafer that has plural semiconductor chips. Each of the plural semiconductor chips includes a first principal side and a second and opposite principal side. Material is removed from the semiconductor wafer to define at least one rounded corner of the first principal side of at least one of the plural semiconductor chips.

Semiconductor chip with a rounded corner

A method for coupling a lid to a support substrate having a semiconductor chip coupled thereto and a clamp fixture. Each semiconductor component has a semiconductor chip mounted to a semiconductor component and a lid coupled to the support substrate via a lid attach material. The lid attach material is cured either using a two-step process that includes a partial cure step followed by a clampless cure step or by curing the die attach material in a clamp fixture without including a pre-cure step. The semiconductor component manufacture decides on the curing approach based on cost and the number of semiconductor components being manufactured. If the semiconductor manufacturer opts for curing with a clamp fixture, the clamp fixture includes a base plate insert on which the semiconductor components are placed and a compression mechanism that includes a compression plate having a compressive material disposed thereon.

Methods and fixture for coupling a lid to a support substrate

A method of fabricating laminate assemblies determines the ideal weight (W) of underfill to be dispensed, based on the size of the semiconductor die and the gap between the die and the laminate substrate. Underfill is dispensed in a single step in an amount between 1.1W and 1.3W to form fillets that cover at least 15% of the height of the semiconductor die on all four sides of the die. The amount of underfill ensures that the fillet coverage imbalance is 30% or less for each of the pairs of opposing sides of the die, thereby improving solder joint reliability.

Method of fabricating reliable laminate flip-chip assembly

A heat spreader-package assembly is provided having a heat spreader mounted to a package board with an adhesive. The heat spreader has an upper portion and a plurality of sidewalls extending from the upper portion. The heat spreader has a flange that extends from the sidewalls continuously about a periphery of the upper portion and has a plurality of holes. The holes allow the uncured adhesive to flow therethrough. When the adhesive has cured, a head is formed from the adhesive on an upper side of the flange to establish a riveted connection.

Heat spreader having holes for rivet-like adhesive connections

An extruded heat exchanger that reduces manufacturing costs and material waste, without compromising heat spreading effects. The heat exchanger has an upper surface that is thermally coupled to a heat sink. Two sidewalls extend only from opposite edges of the upper surface. A flange extends from each of the opposing sidewalls.

Extruded heat spreader

A method for performing inspection of raised electrical contacts, such as BGA and flip-chip-type contacts, and associated underlying vias. An electrical or electronic device or component having a major surface is provided including an array of closely spaced apart BGA flip-chip-type raised contacts with respective underlying vias. An area-of-interest (AOI), including at least one BGA or flip-chip-type contact/via structure is selected. The row containing the AOI is isolated, by computed tomography imaging, via electrical testing, or by removal, for example, from the electrical or electronic device or component. The AOI is mounted on an X-ray transparent substrate; and X-ray transmission imaging of the AOI is performed to inspect the at least one BGA or flip-chip-type contact/via structure for the presence of misalignments, voids, and delaminations.

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Sunnyvale, CA, United States of America

Edward S Alcid