Visa International Service Association

Visa U.s.a. Inc.

Edward Kurtek

Mustafa Cemal Top

Chris S Nelson

Dung Dang Huynh

Johan Ras

Stan Weitz

Marc B Kekicheff

Samantha Phillips

Jan Swart

Ashish Arora

Brahmaiah Thatiparthi

John McNulty, Jr

Adam Vaughan

Dung Huynh

Methods of performing electrostatic discharge testing on a transaction card are disclosed. A transaction card may be placed on an insulated surface. A grounding probe may be placed at a first location on the transaction card. A discharge probe may be charged to a known voltage level. The discharge probe may then be discharged at a second location on the transaction card. A discharge wave shape may be recorded from the ground probe, and one of a pass condition and a fail condition may be assigned based on at least the value of the known voltage level as compared to a reference voltage level. The first location and the second location may each be selected from a plurality of areas on the transaction card.

Method of performing electrostatic discharge testing on a payment card

Testing is performed upon a transaction payment card having a substrate with opposing surfaces, battery powered circuit, and having memory in contact with the substrate to store data that includes an identifier for an account upon which a transaction can be conducted. An electronic component, in contact with the substrate, is powered by the battery powered circuit. In the testing, an electrical measurement is made of the battery powered circuit at each of different times when the card is exposed to an environmental condition. An output of the electrical measurements is made. The environmental condition can be temperature, current pulse applied at different states of charge of the one or more batteries, an acceleration, deceleration, or vibration for a period of time applied to card, a vacuum condition applied to the card, etc.

Testing protocols for extended functionality cards

System and methods for generating one more tests to be performed on a payment device are provided. A vendor selects one or more features to be included in his payment device and provides that information to the system. The system analyzes the information and provides a list of tests to be performed on the reference payment device. In addition, the system also provides a list of one or more reference payment device configurations provided for testing purposes.

System and method for automated selection of testing criteria for payment devices

Methods of performing electrostatic discharge testing on a payment card

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Fremont, CA, United States of America

Edward Kurtek