Advanced Micro Devices Corporation

Edward I Cole, Jr

Michael R Bruce

Rosalinda M Ring

Victoria Jean Bruce

David Harry Eppes

Paiboon Tangyunyong

Arnold Y Louie

Richard Jacob Wilcox

Charles F Hawkins

Jason Mulig

A method and apparatus mechanism for testing data processing devices are implemented. The test mechanism isolates critical paths by correlating a scanning microscope image with a selected speed path failure. A trigger signal having a preselected value is generated at the start of each pattern vector. The sweep of the scanning microscope is controlled by a computer, which also receives and processes the image signals returned from the microscope. The value of the trigger signal is correlated with a set of pattern lines being driven on the DUT. The trigger is either asserted or negated depending the detection of a pattern line failure and the particular line that failed. In response to the detection of the particular speed path failure being characterized, and the trigger signal, the control computer overlays a mask on the image of the device under test (DUT). The overlaid image provides a visual correlation of the failure with the structural elements of the DUT at the level of resolution of the microscope itself.

Data processing device test apparatus and method therefor

Growing community of inventors

New Bernalillo, NM, United States of America

Edward I Cole, Jr