Bell Helicopter Textron Inc.

Textron Innovations Inc.

Sandia National Laboratories

Edward Hohman

Jeffrey Paul Nissen

Robert J Barry

Dennis P Roach

Phil Walkington

Rirk Rackow

Sohan Singh

Jeffrey P Nissen

Dennis Roach

Rick Rackow

A field deployable infrared imaging (FDIR) system and method for inspecting a composite component comprises a hand-held long-wave IR camera to capture a thermal image of the composite component, wherein the camera has an adjustable temperature control that captures an image with a 10 degree working range, a frame capture rate of at least 1 second for a length of time of not less than 90 seconds; and a processor for post-processing the thermal image using a second order derivative algorithm wherein the post-processed thermal image shows the defect better than the captured infrared image, and detects the one or more defects in the composite component.

Nondestructive inspection techniques for rotorcraft composites

A testing apparatus, inspection system, and method for through-transmission ultrasonic testing. The testing apparatus includes a yoke having a support member with a pair of hinge joints, each hinge joint located on an end of the support member; a pair of arms extending from the support member having a hinge end and a pivotable transducer end, each arm being coupled to the hinge joint at the hinge end and extending to the pivotable transducer end; a pair of transducer support members disposed on each of the pivotal transducer ends; and a tension member connected to the pair of arms for aligning the pair of transducer support members during testing.

Through-transmission ultrasonic testing apparatus

A method of inspecting a component using a film overlay including providing the component, the component having a first surface, a core, and a second surface; positioning a film overlay having a reference indicia and a structural indicia on the first surface of the component; aligning the reference indicia on the film overlay with a reference feature on the component; positioning a testing probe on a top surface of the film overlay so the probe is aligned with the structural indicia; and transmitting a signal from the probe through the film overlay, the first surface, the core, and the second surface.

Inspection method using a film overlay

A system and method to inspect flaws associated with a part. The system includes a first image capturing device configured to capture a first set of images of the part and a computer operably associated with first image capturing device and configured to receive and analyze the first set of images. The method includes treating the part with a magnetic particle and fluorescent penetrant processing, capturing a first set of images of an outer surface of the part with the first image capturing device, and identifying a part defect with an algorithm associated with the computer.

Automated magnetic particle and fluorescent penetrant defect detection system

One aspect of a process to inspect a composite component includes traversing multiple ultrasonic probe array portions on respective multiple component surfaces of the composite component. The multiple component surfaces are either separate from or at angles to each other. The process includes simultaneously passing an ultrasonic signal into the multiple component surfaces through the multiple ultrasonic probe array portions. The process also includes receiving a response to the ultrasonic signal through the multiple ultrasonic probe array portions.

Ultrasonic inspection of composite parts

A system and method to inspect flaws associated with a part. The system includes a first image capturing device configured to capture a first set of images of the part and a computer operably associated with first image capturing device and configured to receive and analyze the first set of images. The method includes treating the part with a nital etchant solution, capturing a first set of images of an outer surface of the part with the first image capturing device, and identifying a part defect with an algorithm associated with the computer.

Automated nital etch inspection system

An eddy current probe adapted for detecting cracks in material directly beneath a raised-head fastener is disclosed. The probe comprises an eddy current coil and a support for carrying the coil in an orientation suitable for introducing eddy currents into material directly beneath a raised-head fastener.

Growing community of inventors

Mansfield, TX, United States of America

Edward Hohman