Carl Zeiss Microscopy Gmbh

Carl Zeiss X-Ray Microscopy, Inc.

Edward Hill

Stewart Bean

William B Thompson

Matthew Andrew

Sreenivas Naga Bhattiprolu

Joaquin Correa

Richard Moralee

William Thompson

Benjamin Tordoff

Benjamin Tordorff

A method of enhancing a resolution of an EDS image of a sample includes generating an EDS image of the sample, generating a non-EDS image of the sample generating, using a machine learning algorithm, an enhanced resolution EDS image of the sample based on the generated feature map and based on the first EDS image, where a resolution of the enhanced resolution EDS image is higher than a resolution of the first EDS image.

Grain-based minerology segmentation system and method

The disclosure provides methods and systems for identifying materials using charged particle beam systems combined with x-ray spectroscopy systems.

Method and system for performing EDS analysis

The system described herein relates to analyzing an object using a charged particle beam device generating a beam of charged particles and to the charged particle beam device for analyzing the object. A part of an image of the object corresponding to a volume unit surface of a volume unit is segmented into an area having a first color level and a second color level as well corresponding area fractions are determined. A plurality of particles with color levels are identified by comparing the color levels with the information stored in a database. By comparing the color levels, it is possible to identify the potential particles, for example minerals, which may be included in the volume unit.

Method for analyzing an object and charged particle beam device for carrying out the method

The invention refers to a method and a charged particle beam device for analyzing an object using a charged particle beam interacting with the object. The object comprises a sample embedded in a resin. Interaction radiation in the form of cathodoluminescence light is detected for identifying areas in which the resin is arranged and in which the sample is arranged. Interaction particles are detected to identify particles within the resin and the sample for further analysis by using EDX analysis.

Method of analyzing a sample and charged particle beam device for analyzing a sample

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Huntingdon, United Kingdom

Edward Hill