Massachusetts Institute of Technology

Hrl Laboratories, LLC

Columbia University

Edward H Chen

David T Chang

Dirk Robert Englund

Raviv Perahia

Biqin Huang

Matthew J Pelliccione

Danielle Ann Braje

Phillip R Hemmer

Trina Rae Vian

Joseph John Lacirignola

David Christopher Maurer

David Francis Aubin, Jr

Christopher J Smalt

Kerry Alexander Johnson

Paula P Collins

Christine Michelle Weston

Paul T Calamia

Olha Townsend

Fan Meng

Tim Schroder

Noel Heng Loon Wang

Ren-Jye Shiue

Ophir Gaathon

Mary Katherine Byrd

Shakti Davis

Sensing the electric or strain field experienced by a sample containing a crystal host comprising of solid state defects under a zero-bias magnetic field can yield a very sensitive measurement. Sensing is based on the spin states of the solid-state defects. Upon absorption of suitable microwave (and optical) radiation, the solid-state defects emit fluorescence associated with hyperfine transitions. The fluorescence is sensitive to electric and/or strain fields and is used to determine the magnitude and/or direction of the field of interest. The present apparatus is configured to control and modulate the assembly of individual components to maintain a zero-bias magnetic field, generate an Optically Detected Magnetic Resonance (ODMR) spectrum (with or without optical excitation) using appropriate microwave radiation, detect signals based on the hyperfine state transitions that are sensitive to electric/strain fields, and to quantify the magnitude and direction of the field of interest.

Spin-based electrometry with solid-state defects

A sensing array includes a plurality of pixels, one pixel of which includes: a sensor, the sensor including a first electrode, a second electrode, and an atomic defect site configured to be excited by light of a first frequency; a light source below the sensor and configured to emit light of the first frequency toward the defect site; and a radio frequency (RF) source below the sensor and configured to provide a first voltage to the first electrode, a second voltage to the second electrode, and an RF signal to the sensor, wherein the sensor is configured to sense a magnitude of a physical parameter by generating a photocurrent corresponding to a magnitude of a physical parameter and a differential between the first and second voltages, when excited by the light of the first frequency and affected by the RF signal.

On-chip excitation and readout architecture for high-density magnetic sensing arrays based on quantum defects

An atomic defect sensor for measuring a magnitude of a physical parameter comprises an optical waveguide comprising an atomic defect site located within the optical waveguide, the optical waveguide being configured to guide an optical signal toward the atomic defect site, a first doped fin integrated with the optical waveguide at a first side of the optical waveguide, and a second doped fin integrated with the optical waveguide at a second side of the optical waveguide, wherein the atomic defect site is configured to be energetically stimulated by the optical signal in the presence of an RF signal, and to generate a photocurrent corresponding to the magnitude of the physical parameter and a voltage differential between the first and second doped fins.

Integrated optical waveguide and electronic addressing of quantum defect centers

Sensing the electric or strain field experienced by a sample containing a crystal host comprising of solid state defects under a zero-bias magnetic fields can yield a very sensitive measurement. Sensing is based on the spin states of the solid-state defects. Upon absorption of suitable microwave (and optical) radiation, the solid-state defects emit fluorescence associated with hyperfine transitions. The fluorescence is sensitive to electric and/or strain fields and is used to determine the magnitude and/or direction of the field of interest. The present apparatus is configured to control and modulate the assembly of individual components to maintain a zero-bias magnetic field, generate an Optically Detected Magnetic Resonance (ODMR) spectrum (with or without optical excitation) using appropriate microwave radiation, detect signals based on the hyperfine state transitions that are sensitive to electric/strain fields, and to quantify the magnitude and direction of the field of interest.

Systems, apparatus, and methods for collecting, interpreting, and utilizing noise exposure data may include sensors to obtain an analog signal representative of impulse noise sound pressure and an analog signal representative of continuous noise sound pressure. At least one ADC may generate digital signals by sampling the analog signals at rates equal to or greater than twice the reciprocal of a minimum impulse noise rise time. Accelerometers may obtain data in close proximity to and remote from the sensors. At least one processor may include a first combining node to combine the digital signals to represent both the continuous noise and the impulse noise, a shock-artifact detection filter to identify a time frame including a shock artifact based on the accelerometry data, a frequency filter to generate a background-removed audio signal, an adaptive filter to estimate the shock artifact, and a second combining node to produce a shock-artifact-free audio signal.

High fidelity systems, apparatus, and methods for collecting noise exposure data

Multimode interference can be used to achieve ultra-high resolving powers (e.g., Q&#x3e;10) with linewidths down to 10 pm at 1500 nm and a broad spectroscopy range (e.g., 400-2400 nm) within a monolithic, millimeter-scale device. For instance, multimode interference (MMI) in a tapered waveguide enables fine resolution and broadband spectroscopy in a compact, monolithic device. The operating range is limited by the transparency of the waveguide material and the sensitivity of the camera; thus, the technique can be easily extended into the ultraviolet and mid- and deep-infrared spectrum. Experiments show that a tapered fiber multimode interference spectrometer can operate across a range from 500 nm to 1600 nm (B=1.0576) without moving parts. The technique is suitable for on-chip tapered multimode waveguides, which could be fabricated in high volume by printing or optical lithography, for applications from biochemical sensing to the life and physical sciences.

Methods and apparatus for spectrometry using multimode interference in a tapered spiral-shaped waveguide

Techniques for deterministic switch microscopy include resolving at least one nitrogen vacancy center in a diamond structure. A magnetic field can be applied across the diamond structure and the nitrogen vacancy centers can be optically excited. The nitrogen vacancy centers can be switched from a dark state to a bright state or a bright state by a dark state by applying at least one microwave pulse. A fluorescent response of each nitrogen vacancy center can be detected and a nitrogen vacancy center can be resolved based on the fluorescent response of each nitrogen vacancy center as it corresponds to the orientation of the nitrogen vacancy center relative to the applied magnetic field.

Systems and methods for deterministic emitter switch microscopy

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Edward H Chen