The Boeing Company

Other

Edward G Sergoyan

Robert G Olsen

Ronald A Bradley

Jimmy Susumu Takeuchi

Patrick Lee Anderson

Anthony D Monk

Christopher Wayne Fay

Ronald D Curl

Lindsey M Caton

Clifford C Olmsted

Michael Von Dadelszen

Milton Perque

Corbin Champion

G Dale Davis

Kirk Jackson

A microwave paint thickness sensor includes a single cylindrical cavity, a microwave source, and a signal detector. The cylindrical cavity is open at one end, the open end having a choke joint for interfacing with a painted surface. The cylindrical cavity is designed so that the electronic field is normal to the painted surface. In a preferred embodiment, this is accomplished by providing an optimally designed TM011 mode cavity. In this configuration, the resonant frequency of the cavity is linearly related to the inverse of the paint thickness. In accordance with one aspect of the present invention, the resonant cavity is optimally sized to resonate at a frequency where the sensor footprint can be minimized. Thus with the use of the choke joint, the small sensor interface area of the present invention may easily be applied to a curved surface.

Microwave paint thickness sensor

A remotely controlled, traction wheel driven, transporter moves inspection equipment within a walled cavity to check internal structural features. The inspection equipment can be mounted on a positioner pushed by the transporter, which adjusts with changing dimensions of the cavity so as to maintain the inspection equipment in a desired position or attitude, for example, centered within the cavity.

Apparatus for transporting and positioning an inspection device within a walled cavity

A method and apparatus are provided for measuring a thickness of a nonconductive coating disposed over portions of first and second conductive surfaces that intersect at an intersection angle. The apparatus is a thickness measurement gauge having an eddy current sensor. The thickness measurement gauge includes an eddy current sensor and electronic analyzer. The thickness gauge may be provided with a pressure enclosure. A method of calibrating a thickness measurement gauge and a calibration stand are also provided. The calibration stand has third and fourth conductive surfaces intersecting at the intersection angle. The conductivities of the third and fourth surfaces correspond to the conductivities of the first and second surfaces.

Method and apparatus for measuring a thickness of a nonconductive coating and calibrating a thickness measurement gauge

A measurement device for measuring a thickness of a film layer over a substrate utilizes a microwave source and a resonant cavity having an open side. A microwave signal is introduced at a first end of the resonant cavity with the open side against a surface measurement sample having a film layer over a substrate, and an output signal detector senses the output power of the signal at a far end of the resonant cavity. A processor uses a difference in the resulting resonant frequency of the cavity from that using a substrate without the film layer to determine the thickness of the film layer.

Thickness measuring apparatus and method using a microwave cavity resonator

Film thickness measurement systems and methods are provided that utilize a signal generator having a Gunnplexer design and a resonant frequency detector to correlate the shift in resonant frequency experienced by a resonant cavity having one face abutting a test object. The shift is resonant frequency is determinative of a linear or near linear correlation between film thickness and the resonant frequency shift.

Thickness measuring systems and methods using a cavity resonator

A method for measuring a thickness of a non-conductive coating on a semi-conductive substrate includes placing a pair of conducting plates in contact with the non-conductive coating. A capacitance value of the non-conductive coating in combination with the semi-conductive component is measured using a capacitance meter. The measured capacitance value of the non-conductive coating in combination with the semi-conductive component is then used to determine an independent capacitance value of the non-conductive coating. The thickness of the non-conductive coating is directly related to the independent capacitance value of the non-conductive coating.

Measurement of a coating on a composite using capacitance

The present invention provides a method and apparatus for use in measuring a thickness of a layer and/or variations in layer thickness for layers that are flat, curved or have curves. The apparatus comprises a light source to generate a light beam, a light beam detector to detect at least a portion of the light beam reflected, an eddy current field generator that induces an eddy current, an eddy current detector to detect the induced eddy current and a processor coupled with the light source, light detector, eddy current field generator and eddy current detector, wherein the processor controls the light detector, eddy current field generator and eddy current detector. A radial characteristic of a region of the surface can be determined, a scaling factor can be determined based on the radial characteristic and a measured distance can be scaled based on the scaling factor in determining a thickness.

Method and apparatus for non-contact thickness measurement

A portable system is provided for inspecting presence of a coating on a surface. The portable system includes an optical source and a portable optical probe in optical communication with the optical source. The portable optical probe is arranged to access a surface, emit light onto the accessed surface, and receive light reflected by the accessed surface. A portable color discriminator is in optical communication with the portable optical probe and is arranged to discriminate colors of light received by the portable optical probe. A portable logic controller is arranged to determine presence of a coating on the accessed surface responsive to the discriminated colors of the reflected light. Optional configurations of the portable optical probe, including telescopic, 90 degree, and pivoting sensor tips, allow optical inspection of hard-to-reach surfaces as desired.

Corrosion inhibitor compound portable detector

A triple point screen which electrically insulates the high voltage electrode in the discharge region of a gas discharge laser system. The screen is formed from an inorganic dielectric to withstand the corrosive atmosphere of the gas discharge laser. The triple point screen has a grounded conductive metal screen molded into the dielectric and positioned close to the triple point of the anode to substantially reduce the strength of the electric fields at the triple point.

Growing community of inventors

Mill Creek, WA, United States of America

Edward G Sergoyan