Luminex Corporation

Charted Scientific Inc.

Edward Calvin

Wayne Dennis Roth

Dung T Duong

Charles J Collins

A system for filtering light using a spectrometer enhanced with spectral filters using an array of independent photodetectors to measure the fluorescent or scattered light signal. A system comprising a light source, an illuminated sample, a light spectrum device, a collimator lens, a plurality of spectral filters each having a varying and selected light transmission spectrum and a plurality of photodetectors wherein each photodetector is oriented to a spectral filter. A scanning cytometer for measuring fluorescence and light scattering from an illuminated portion of the sample comprising a first light source, a scanner scanning in two axes, a fluorescence detector, an objective lens, an optically translucent medium through which a sample may be illuminated and a confocal apparatus positioned distally from the light source and sample and through which light signals from the sample are transmitted to a fluorescence detector.

Method and apparatus of filtering light using a spectrometer enhanced with additional spectral filters with optical analysis of fluorescence and scattered light from particles suspended in a liquid medium using confocal and non confocal illumination and imaging

An optical analysis apparatus, including: a sample delivery system from which a liquid sample may be delivered in operation; a flow cell defining a channel through which, in operation, the delivered liquid sample may flow at a controllable rate, the channel including an optical analysis region; an illumination source focused on a portion of the optical analysis region that, in operation, illuminates a single particle at a time in a stream of the sample wider than the single particle; a detector that, in operation, detects light resulting from the illumination of the sample and outputting a signal representative of the detected light; and an analysis system receiving the representative signal.

Method and apparatus for optical analysis

Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.

Systems and methods for performing measurements of one or more materials

Methods for altering one or more parameters of a measurement system are provided. One method includes analyzing a sample using the system to generate values from classification channels of the system for a population of particles in the sample. The method also includes identifying a region in a classification space in which the values for the populations are located. In addition, the method includes determining an optimized classification region for the population using one or more properties of the region. The optimized classification region contains a predetermined percentage of the values for the population. The optimized classification region is used for classification of particles in additional samples.

Methods for altering one or more parameters of a measurement system

Methods, data structures, and systems for classifying particles are provided. In particular, the methods and systems are configured to acquire a first set of data corresponding to measurable parameters of a microparticle and identify a location of a look-up table to which the first set of data corresponds, wherein the look-up table is framed by values associated with at least one of the measurable parameters. Furthermore, the methods and systems are configured to determine whether the first set of data fits one or more predefined algorithms respectively indicative of a different microparticle classification associated with the identified location of the look-up table. The methods and systems are further configured to classifying the microparticle within at least one predefined categorization based upon the determination of whether the first set of data fits the one or more predefined algorithms.

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Houston, TX, United States of America

Edward Calvin