Silicon Graphics, Incorporated

Xilinx, Inc.

Juniper Networks, Inc.

Edward C Priest

David P Chengson

Ali Mira

Unmesh Agarwala

John C Manton

Alan D Foster

William L Schmidt

Martin L Voogel

Hing Yan To

David James Ofelt

Bhavesh Patel

Yanran Chen

Hansel A Collins

Granthana Kattehalli Rangaswamy

Scott W Alvarez

Some examples described herein provide for an on-die virtual probe in an integrated circuit structure for measurement of voltages. In an example, an integrated circuit comprises a voltage-controlled frequency oscillator circuitry and a processor circuitry. The voltage-controlled frequency oscillator circuitry comprises a plurality of circuitry components and is configured to generate a signal having a frequency related to a supply voltage. The voltage-controlled frequency oscillator circuitry is disposed at a location of the integrated circuit proximal to the supply voltage being monitored. The processor circuitry is configured to identify a relationship between the frequency of the signal and the supply voltage. The processor circuitry is also configured to determine a value of the supply voltage associated with the signal based on the identified relationship. The processor circuitry further monitors on-die transient voltages at the location of the integrated circuit based on the value of the supply voltage.

On-die virtual probes (ODVP) for integrated circuitries

In an example of this disclosure, a method may include receiving, by a bit error location analyzer, a split information signal at a second data rate derived from an information signal at a first data rate. In this example, the second data rate is less than the first data rate, and the bit error location analyzer may be incapable of performing error analysis at the first data rate The method may include performing error analysis, by the bit error location analyzer, on information represented by the split information signal. In some examples, performing error analysis may include comparing the information represented by the split information signal to an information seed to determine a plurality of bit error locations in the information represented by the split information signal relative to the information seed.

Systems and methods for error detection and correction

A processor-inclusive memory module (PIMM) is disclosed. In one embodiment of the present invention, the PIMM includes a printed circuit board having first and second opposing surfaces. The printed circuit board also has an address line formed therein. A first SRAM is mounted on the first surface of the printed circuit board. The present PIMM is further comprised of a second SRAM mounted on the second surface of the printed circuit board. The second SRAM is mounted on the second surface of the printed circuit board directly opposite the first SRAM mounted on the first surface of the printed circuit board. The first and second SRAMs are coupled to the address line by respective cache buses. A processor is also mounted on the first surface of the printed circuit board, and is coupled to the address line. In one embodiment of the invention, a heat sink is thermally coupled to the processor. The processor has a plurality of contact pads disposed thereon. Electrical connectors extend from the second surface of the printed circuit board. The electrical connectors are electrically coupled to respective contact pads of the processor. In the present PIMM, the electrical connectors are adapted to be removably attached to a mother board. In so doing, the present PIMM is removably attachable to a mother board.

Processor-inclusive memory module

The present invention incorporates a variable delay circuit to add delay to a clock signal. In a preferred embodiment of the present invention, the delay is determined and fixed by a circuit employing the concept of a lock-and-leave circuit. This has the effect of fine tuning the delay determined by the lock-and-leave circuit. Mode bits allow a user to control the rate at which fine tuning occurs. Three update rates are provided in a preferred embodiment of the present invention. They are slow, medium, and fast.

System and method to reduce jitter in digital delay-locked loops

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San Jose, CA, United States of America

Edward C Priest