International Business Machines Corporation

Edward B Eichelberger

David William Boerstler

Thomas W Williams

Charles B Winn

Gary T Hendrickson

Eric Lindbloom

Franco Motika

Ronald Gene Walther

John A Waicukauski

Gordon J Robbins

William M Chu

John L Sinchak

Eugene Igor Muehldorf

Roger N Langmaid

Richard Frank Rizzolo

Francis H Chan

Stephen E Bello

David A Kiesling

Eugen Igor Muehldorf

John A Ludwig

Rolf O Bergenn

Sumit Das Gupta

A level shifting circuit operating at low power with minimal signal delays. The circuit employs high capacitance diodes to shift signals from a first signal level to a second higher or lower signal level. The capacitance is obtained by either providing a discrete capacitor shunt across the diode or by using diode connected transistors. Diode connected transistors are biased to provide the necessary capacitance. A pair of high capacitance diode level shifters is used as a differential pair level shifter by connecting the reference resistors to a common reference potential.

Speed enhanced level shifting circuit utilizing diode capacitance

A low signal margin detect circuit for detecting reduced signal levels in differential current switch (DCS) or current switch emitter follower (CSEF) circuits. The circuit is connected to the outputs of a DCS circuit or to the output of a current switch emitter follower circuit and a reference voltage. A signal difference between the inputs is determined and, if less than an established amount, an error signal is generated. The detect circuit is enabled by a TESTBIAS signal. Two error signals are developed, ERRORX and ERRORY, which can be dotted with the error signals from adjacent circuits in the X and Y directions. This enables detection of the failing circuit through the use of appropriate error signal detection devices.

Low signal margin detect circuit

An output stage device for an enhanced differential current switch. The output stage receives a differential signal pair from a prior logic stage and must shift the output signals to the levels necessary for the next stage. The output stage has a differential pair of emitter followers that are capacitively cross coupled. Capacitors couple the collector of a first transistor to the emitter of the second. The capacitors can be formed from forward biased diodes or transistors. The result is a more rapid falling output transition while reducing power requirements.

Capacitively cross-coupled DCS emitter-follower output stage

A compensating upshift circuit providing low signal degradation and operating at high speed and at low power. Capacitor shunted diodes cross-couple the collectors and bases of two transistors. The cross-coupling eliminates signal swing degradation in the upshift circuit and controls current through the two collector resistors. Equalized collector resistor current eliminates signal swing degradation while providing an upshift circuit with short delays. The capacitor shunted diodes can be replaced by diode connected transistors configured to provide the necessary collector-base capacitance.

Enhanced differential current switch compensating upshift circuit

A low power push pull off chip driver for differential cascode current circuitry is described that includes the collectors of a differential pair directly coupled to bases of a push pull driver and level shifters coupled to the input of the differential pair to prevent saturation of the differential pair.

Low power push pull driver

A method and apparatus for testing very large scale integrated circuit devices, most particularly Level Sensitive Scan Design (LSSD) devices, by applying differently configured sequences of pseudo-random patterns in parallel to each of the input terminals of the device under test, collecting the output responses from each of the output terminals in parallel, combining these outputs to obtain a signature which is a predetermined function of all of the sequences of parallel outputs and comparing the test signature with a known good signature obtained by computer simulation. The input test stimuli are further altered in a predetermined fashion as a function of the structure of the device to be tested, to individually weight the inputs in favor of more of less binary ones or zeros.

Weighted random pattern testing apparatus and method

A masterslice cell wireable to form any of a selected book set of two level differential cascode current switch basic circuits. Twenty percent increased performance is provided as compared with ECL masterslice circuits running at the same power. In spite of increased wire due to differential logic, and potential increased complexity in design software, the invention is actually readily adaptable to existing masterslice design systems.

Two-level differential cascode current switch masterslice

A method and apparatus for testing very large scale integrated circuit devices, most particularly Level Sensitive Scan Design (LSSD) devices, by applying differently configured sequences of pseudo-random patterns in parallel to each of the input terminals of the device under test, collecting the output responses from each of the output terminals in parallel, combining these outputs to obtain a signature which is a predetermined function of all of the sequences of parallel outputs and comparing the test signature with a known good signature obtained by computer simulation. The input test stimuli are further altered in a predetermined fashion as a function of the structure of the device to be tested, to individually weight the inputs in favor of more or less binary ones or zeros.

A PLA is constructed to improve random testing. Section circuits are provided that permit disabling sections of the output lines that are called segments so that the circuit can be tested one segment at a time. Selection circuits are also provided for enabling the product term lines only one at a time. Thus, while random test signals are conventionally applied to the PLA input terminals for test, only a small portion of the PLA is enabled for the test. Control signals for the selection circuits are generated randomly so that the portion of the PLA that is tested is varied randomly.

Random pattern self test design

Level sensitive testing is performed on a generalized and modular logic with embedded array system that is utilized as an arithmetic/logical unit in a digital computer. Each arithmetic/logical unit of a computer is formed of arrangements of combinational logic networks, arrays and storage circuitry. The storage circuitry has the capability for performing scan-in/scan-out operations independently of the system input/output and controls. Using the scan capability, the method of the invention provides for the state of the storage circuitry to be preconditioned and independent of its prior history. Test patterns from an automatic test generator are cycled through the networks of combinational logic and arrays and their respective associated storage circuitry for removal through the scan arrangement to determine their fault status.

Method of level sensitive testing a functional logic system with

The disclosure relates to LSSD systems for use in digital computers and the like. More particularly, to an organization of logic in such systems to render the clock networks testable with minimal overhead. The advantages of the practice of the invention are particularly apparent and enhanced when the invention is employed in a Level Sensitive Scan Design (LSSD) System generally of the type disclosed in U.S. Pat. No. 3,783,254 and U.S. patent application Ser. No. 701,052, filed June 30, 1976.

Reduced overhead for clock testing in a level system scan design (LSSD)

Disclosed is an improved clock generation network. The improved clock generation network is particularly adapted to, and has particular utility when employed in a Level Sensitive Logic System generally of the type disclosed in U.S. Pat. No. 3,783,254, of common assignee. The disclosed clock generation network also has particular utility in a Level Sensitive Embedded Array Logic System of the type disclosed in U.S. patent application Ser. No. 701,052, filed June 30, 1976, by Messrs. E. B. Eichelberger, E. I. Muehldorf, R. G. Walther and T. W. Williams and of common assignee.

Clock generation network for level sensitive logic system

Propagation delay testing is performed on a generalized and modular logic system that contains embedded arrays and can be used as arithmetic/logical/control unit in a digital computer or data processing system. Each such unit can be composed of combinatorial logic and storage circuitry. The storage circuitry may be of two types, randomly arranged latches, or arrays of storage cells. In the organization presented here the latches are arranged such that they have the capability of performing scan-in/scan-out operations independently of system control. Using this scan capability, the method of the invention provides for the state of the storage latches to be preconditioned and independent of prior circuit history. Selected propagation paths are sensitized by patterns from an automated test generator or designer supplied patterns. By alternating selected inputs and by applying proper timing control, propagation delay indications through the selected paths are obtained to determine delay behavior of the logic system.

Method of propagation delay testing a level sensitive array logic system

A generalized and modular logic system is described for all arithmetic/logical units and their associated control storage and any other arrays. The logic system is partitioned into sections formed of combinational logic networks, storage circuitry, and arrays. The storage circuitry is sequential in operation and employs clocked dc latches. Two or more synchronous, non-overlapping, independent system clock trains are used to control the latches. The array is a rectangular array of storage element, M .times. N where, M is the number of words in the array and N is the number of bits in each word. The array may be read only, or it may be a read/write array. The array may be a programmable logic array (PLA). A single-sided delay dependency is imparted to the system. The feedback connections from the respective latch circuitry are made through combinational logic or an array to other latch circuitry. The clocking of the latches and of the array, if any, are such that the network may be operated in a race free mode. With each latch, there is provided additional circuitry so that each latch acts as one position of a shift register having input/output and shift controls that are independent of the system clocks and the system input/outputs. All of the shift register latches are coupled together into a single shift register. The logic between the latch inputs and the array inputs has the property that a 1 to 1 correspondences can exist between array inputs and the latch inputs. Furthermore, all of the array outputs are uniquely detectable at the latch or primary outputs.

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Hyde Park, NY, United States of America

Edward B Eichelberger