Ion Optics, Inc.

Nomadics, Inc.

Other

Flir Systems, Incorporated

Edward A Johnson

James T Daly

Irina Puscasu

John S Wollam

Mark P McNeal

Martin U Pralle

William Andrew Bodkin

W Andrew Bodkin

Andrew Bodkin

Theodore F Morse

Peter G Loges

Michael J Groden

Mark P Mcneal

Methods and apparatus for providing a tunable absorption-emission band in a wavelength selective device are disclosed. A device for selectively absorbing incident electromagnetic radiation includes an electrically conductive surface layer including an arrangement of multiple surface elements. The surface layer is disposed at a nonzero height above a continuous electrically conductive layer. An electrically isolating intermediate layer defines a first surface that is in communication with the electrically conductive surface layer. The continuous electrically conductive backing layer is provided in communication with a second surface of the electrically isolating intermediate layer. When combined with an infrared source, the wavelength selective device emits infrared radiation in at least one narrow band determined by a resonance of the device. In some embodiments, the device includes a control feature that allows the resonance to be selectively modified. The device has broad applications including gas detection devices and infrared imaging.

Thin film emitter-absorber apparatus and methods

A blackbody radiation device () includes a planar filament emission element () and a planar detector () for respectively producing and detecting radiation having width dl/l less than about 0.1 to test a sample gas, where l is the wavelength of the radiation; a reflector (); a window (W); an electrical control (); and a data output element ().

Infrared radiation sources, sensors and source combinations, and methods of manufacture

An infrared emitter, which utilizes a photonic crystal (PC) structure to produce electromagnetic emissions with a narrow hand of wavelengths, includes a semiconductor material layer, a dielectric material layer overlaying the semiconductor material layer, and a metallic material layer having an inner side overlaying the dielectric material layer. The semiconductor material layer is capable of being coupled to an energy source for introducing energy to the semiconductor material layer. An array of surface features are defined in the device in a periodic manner or quasi-periodic. The emitter device is adapted to emit electromagnetic energy having spectral characteristics determined by parameters of the periodically distributed surface features, the parameters including shape, size, depth, distribution geometry, periodicity, material properties and defects.

Tunable photonic crystal

An infrared emitter, which utilizes a photonic crystal (PC) structure to produce electromagnetic emissions with a narrow band of wavelengths, includes a semiconductor material layer, a dielectric material layer overlaying the semiconductor material layer, and a metallic material layer having an inner side overlaying the dielectric material layer. The semiconductor material layer is capable of being coupled to an energy source for introducing energy to the semiconductor material layer. An array of surface features are defined in the device in a periodic manner or quasi-periodic. The emitter device is adapted to emit electromagnetic energy having spectral characteristics determined by parameters of the periodically distributed surface features, the parameters including shape, size, depth, distribution geometry, periodicity, material properties and defects.

An absorption spectroscopy apparatus including a sample cell having a central axis, and a side wall coaxially positioned about the axis. The side wall defines a generally circular cross-section of the cell as taken along a plane extending perpendicular to the axis, wherein the generally circular cross-section of the sample cell has an average radius. The side wall includes a plurality of light reflective segments arrayed about the axis, wherein each reflective segment has a cross-section taken along a plane extending perpendicular to the axis of the cell that is concave with respect to the axis. The concave cross-section of each segment has an average radius that is unequal to the average radius of the generally circular cross-section of the sample cell. Among other aspects and advantages, the apparatus of the present disclosure is able to use incoherent, non-collimated light sources while maintaining high optical throughput efficiencies.

Absorption spectroscopy apparatus and method

A blackbody radiation device () includes a planar filament emission element () and a planar detector () for respectively producing and detecting radiation having width dl/1 less than about 0.1 to test a sample gas, where 1 is the wavelength of the radiation; a reflector (); a window (W); an electrical control (); and a data output element ().

An apparatus for detecting a gas having distinct infrared radiation absorption characteristics. The apparatus includes a spectral source/bolometer for conducting an electrical current and for producing an infrared radiation. The source/bolometer is disposed along an axis and has a temperature and a characteristic resistance, and the characteristic resistance is a predetermined function of the temperature. A return reflector is disposed along the axis beyond the gas such that at least a portion of the infrared radiation passing through the gas is reflected back through the gas to the source/bolometer. The apparatus also includes a driver/detector for driving a current through the source/bolometer, for determining the characteristic resistance, and for detecting the gas from a variation of the characteristic resistance.

Gas detection apparatus using a combined infrared source and high temperature bolometer

An improved gas detector apparatus includes a spectral source/bolometer for conducting an electrical current and for producing infrared radiation. The source/bolometer has a characteristic resistance that is a predetermined function of the source/bolometer temperature. A concentrating reflector directs the infrared radiation through a spectral filter and the gas. A return reflector is disposed along the axis beyond the spectral filer and the gas, such that at least a portion of the infrared radiation passing through the filter and the gas is reflected back through the gas and the filter to the source/bolometer. A driver/detector drives a current through the source/bolometer, determines the characteristic resistance of the source/bolometer, and detects the gas from a variation of the characteristic resistance.

A spectrometer system comprises (i) a slab waveguide characterized as an index of refraction higher than a surrounding medium, and having front surface and a rear surface opposite thereto, the front surface including a input portion for accepting optical radiation, a diffractor portion and an exit portion, (ii) a diffraction grating disposed on said diffractor portion of said front surface, (iii) a detector array aligned adjacent to the exit portion, and (iv) a mirror coated on the rear surface of the waveguide. Radiation transmitted within the waveguide from the input portion is reflected and collimated by the mirror to the granting. Light diffracted from the grating is dispersed to the mirror and reflected toward and through the exit portion and onto the array.

Monolithic infrared spectrometer apparatus and methods

A fiber optic reflectometer employs an optical fiber near a target substrate in a deposition chamber. The optical fiber is positioned within the chamber so that deposition of a thin film on the substrate also occurs on a portion of the optical fiber. A combination of monochromatic and broadband white light is transmitted through the optical fiber to the film deposited on it, and light reflectance measurements are made to determine, in situ and substantially in real time, such characteristics of the film as its growth rate, thickness, composition, surface roughness and refractive index. Such measurements can be made without bulk optics and without the precise alignment requirements of ellipsometry techniques and apparatus.

Fiber optic reflectance apparatus for in situ characterization of thin films

An improved IR radiation source is provided by the invention. A radiation filament has a textured surface produced by seeded ion bombardment of a metal foil which is cut to a serpentine shape and mounted in a windowed housing. Specific ion bombardment texturing techniques tune the surface to maximize emissions in the desired wavelength range and to limit emissions outside that narrow range, particularly at longer wavelengths. A combination of filament surface texture, thickness, material, shape and power circuit feedback control produce wavelength controlled and efficient radiation at much lower power requirements than devices of the prior art.

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Bedford, MA, United States of America

Edward A Johnson