Dilor

Jobin Yvon S.a.

Instruments S.a.

Horiba Jobin-yvon, Inc.

Jobin Yvon Sas

Edouard Da Silva

Michel DelHaye

Bernard Roussel

Jacques Barbillat

Michel Leclercq

Bernard Drevillon

Gerard Martinez

Benferhat Ramdane

Quy Dao Nguyen

Michel Delhaye

The invention concerns a Raman spectrometry apparatus containing a source of excitation (), optical means () of excitation directing a beam of excitation () derived from that source on the sample (), means () for collecting the energy diffused by the sample () containing an inlet diffusion slot (), a spectral dispersion system (), means for selecting the Raman energy (), a detector (), optical detection means () directing the Raman energy thus collected and selected to the detector (). According to the invention, the optical means () of excitation cause the beam of excitation () to be dispersed by the dispersion system (), said optical means () of excitation containing an inlet slot () and an outlet slot of excitation constituted by the inlet diffusion slot () and selecting the wavelength of excitation.

Raman spectrometry apparatus

The invention relates to a spectrometer () comprising a dispersive element of a light beam formed of a set of spectral components, the dispersive element generating spatial dispersion of the spectral components in the form of a dispersion spectrum () spatially spread, at least one photon detector () comprising at least one detection element () being provided at one point of said dispersion. According to the invention, a matrix optical electromechanical device () is provided between the dispersive element and the detector in the dispersion spectrum, said electromechanical device being formed of a matrix of optical elements, each of the optical elements being able to send back a portion of the dispersion spectrum according to at least two directions in relation to a control signal, in order to enable the selection of at least one sub-assembly of the spectrum for said detection element. A method and an application of the spectrometer are claimed.

Spectrometer comprising active matrix optics

An inelastic diffusion spectrometric imaging apparatus includes an illuminating and energising system including a confocal first aperture and a second confocal aperture combined with the first. A first deflector assembly scanning for scanning a sample and a second deflector assembly sychronised with the first, are placed respectively downstream and upstream of the second confocal aperture and a spectrometer. The input aperture of the spectrometer merges with the second confocal aperture.

Spectrometric imaging apparatus

The invention concerns an apparatus for optically characterising a thin-layer material by backscattering Raman spectometry comprising a frame, a monochromatic excitation laser source ( ), optical means ( ) directing a light flux emitted by the source towards the material to be characterised, provided with means ( ) homogenising the distribution of energy per surface unit, over a minimum surface of some tens of square micrometers, and means for collecting ( ) and selecting ( ) the light diffused by Raman effect. The apparatus further comprises reflectometric measuring means ( ) integral with the Raman measuring means, including reflectometric excitation means ( ) directed on the same sample zone as the Raman excitation means.

Apparatus for optically characterising thin layered material

In an optical fittering device comprising at least two fitters, the first filter (EF1) is tilted by an angle of incidence whose value is adjusted to bring the cut-off limit of the first filter (EF1) closer to one of the sides of the line of the illumination beam (FLA), which reduces the optical density of the first filter, while the association in series of the first (EF1) and second (EF2) filters enables to obtain a high-pass filtering whose global density corresponds to the sum of the densities of the first and second filters and whose cut-off limit is lower than that obtained by a single filter tilted to its optimum angle. A third filter (EF3) mounted in parallel with respect to the first and second filters (EF1 and EF2) enables to obtain, at the level of the common collection path (TCC), a band eliminating filtering whose cut-off limits are positioned on either side of the illumination line with a view to an optimum analysis of the low frequency lines.

Process and device for optimizing the position and the width of the

The spectrometry apparatus of the present invention includes, in addition to conventional analysis, a first diaphragm having a first chosen variable aperture for spatially filtering a coherent-excitation beam. The apparatus also includes a first deflector stage (DF1) for sweeping an excitation beam over a sample according to a first chosen deflection. Additionally, there is included a second diaphragm having a second variable aperture conjugate with the first aperture for filtering the incoherent-scattering beam. The spectrometry apparatus further provides a second deflector stage placed downstream in order to sweep the spectral image of the incoherent-scattering beam thus filtered over the multichannel detection module according to a second chosen deflection.

Spectrometry apparatus

A sample which is exposed to excitation radiation scatters light to a separator filter. The scattered light includes a Raman spectrum. The separator filter reflects, a spectral band of the radiation which it receives and transmits, the remainder of the radiation which it receives. The reflected spectral band is centered on the excitation radiation. The spectral band is collected and guided to a band-eliminating filter in order to eliminate therefrom a spectral band which is narrower than the reflected spectral band, and which embraces the wavelength of the excitation radiation. The band-eliminating filter has a steep elimination slope. A signal corresponding to the reflected spectral band, from which the narrow band has been eliminated in this way, is combined with the radiation transmitted by the separator filter and the combined radiations are supplied to a detection and analysis unit.

Combined complementary filtering spectrum analysis device, in particular

The filtration means filter the exciter radiation (EX) in a first forward direction from generator means (LS) to the specimen (EC), by allowing a second spectral band (BZ) of predetermined spectral width (l) and centered on a selected frequency corresponding to the wavelength of the exciter radiation (L0) to pass and stopping a first spectral band (FZ) complementary to the second spectral band (BZ), while substantially simultaneously with this first filtration operation, these filtration means further filter the analysis radiation (ON) in a second direction that is the reverse of the first direction, by allowing the first spectral band (FZ) to pass and stopping the second spectral band (BZ).

Spectral-band filtration spectrometry apparatus

The invention relates to a spectrometry installation comprising an inlet, optical fiber means suitable for receiving an inlet beam and delivering a spectrally dispersed image of the beam which image is limited to a selected spectral band, a multi-channel detection module receiving said spectral image, and processor means. The optical filter means are provided with a deflector stage. Control means are associated with the optical deflector means to define the spectral band in terms of center frequency and band width, and control means are associated therewith for displacing the spectral image over the detection module. An electronic control unit is provided to control the control means and to control the processor means in a plurality of operating modes, each of which comprises joint control of the selected spectral band, of the displacement of the spectral image, and of the processor means, for the purpose of selectively using a particular set of detector components.

Dispersive spectrometry installation with multi-channel detection

A monochromator having a concave holographic grating which is turnable in rotation and provided with an inlet slot parallel to the lines of the grating for incident light and an outlet slot also parallel to the lines of the grating, the inlet and outlet slots being disposed on opposite sides of a diametrial median plane P of the grating extending perpendicular to the lines of the grating and passing through the center of the grating. The bisector of the angle A, formed by two lines connecting the center of each slot to the center of the grating is contained in the plane P, the slots being additionally disposed such that the projection .alpha. of the angle A on the plane P is .ltoreq. 3.degree. and the projection .beta. of the angle A on the plane P' containing the bisector and perpendicular to the plane P is .ltoreq. 15.degree.. Two elementary monochromators can be connected in series and the gratings of the elementary monochromators are carried by a common rotation shaft, the image of the outlet slot of one elementary monochromator being sent to the inlet slot of the following monochromator by an optical system composed of planar mirrors, and a spherical mirror extending parallel to the gratings and turnable around an axis parallel to the axis of the shaft. SU

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Lille, France

Edouard Da Silva