Taiwan Semiconductor Manufacturing Comp. Ltd.

Edna Fang

Ming-Yih Wang

Tsung-Yang Hung

Chi-Che Wu

Jia-Ming Guo

A circuit screening system includes a target circuit under test, a power circuit, and a clock generating circuit. The target circuit under test receives a first testing signal in a first period, and a second testing signal in a second period, and the first testing signal is different from the second testing signal. The power circuit provides a supply voltage to the target circuit under test, wherein a voltage level of the supply voltage maintains at a first voltage level in the first period, is pulled up to a second voltage level and back to the first level after the first period, and maintains at the first voltage level in a second period after the first period. The clock generating circuit provides a clock signal to the target circuit under test, wherein the clock signal has different profiles in the first period and the second period.

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Hsinchu, Taiwan

Edna Fang