International Business Machines Corporation

Hitachi Global Storage Technologies Netherlands B.v.

Leica Microsystems Semiconductor Gmbh

Imstec Gmbh

Edgar Maehringer-Kunz

Christian Laue

Achim Busch

Frank Geisenheiner

Ines Mattern

Norbert Jakob

Achim Kreckel

Rainer Klaus Krause

Matthias Loeffler

Michael Veith

Reinhard Rode

Tanja Schneider

Gerald Jarschel

Kathrin Eggelbusch

Volker Knorz

A device for automatic illumination and inspection of tubular probes, in particular stents, is proposed, with rotatable means for holding the probes that are to be inspected, with an electronic camera and associated lens, with a computer-based electronic imaging system, and with means for illuminating the probe that is to be inspected. The probe surfaces are illuminated by means of a combination of dark field illumination and transillumination.

Automatic inspection device for stents, and method of automatic inspection

A method for mounting a machine element to a work piece in one embodiment includes performing a mounting process for mounting a machine element to a work piece; and sucking air from a vicinity of the machine element while moving the machine element during at least part of the mounting process. A method for mounting a machine element to a work piece in another embodiment includes feeding a machine element to an actuation section of handling and actuation apparatus using a feeding section; sucking air in the vicinity of the machine element during the feeding of the machine element; initiating an actuation section for mounting the machine element to a work piece using a moveable actuation member; and sucking air in the vicinity of the actuation member at least during operation of the actuation member.

Method for mounting an element to a work piece

An automated system for illuminating and inspecting the inner surface areas of tubular samples, especially stents, is disclosed. The system comprises rotatable means for receiving the sample to be inspected; at least one fluorescent surface area arranged in the immediate vicinity of the sample to be inspected; an UV-light source for illuminating the at least one fluorescent surface area; an electronic line-scan camera for inspecting the sample; and a computer based electronic imaging system, functionally connected to the camera, whereby the imaging system creates a line-by-line image of an area extending along the length of the sample as it rotates under the camera.

Automated inspection system and method

A handling and actuation apparatus particularly adapted for clean room applications includes an actuation section for mounting a machine element to a work piece. The actuation section comprises a movable actuation member. A feeding section for feeding the aforementioned machine element to the actuation section is provided. An inner debris suction section is positioned in the vicinity of the actuation section, the inner debris suction section sucking air from the vicinity of the actuation member. An outer debris and air suction section is positioned in the vicinity of the feeding section sucks air from the vicinity of machine element during feeding of the machine element.

Handling and actuation apparatus

The invention relates to a method and a system for testing a head gimbal assembly, the system comprising means () for inputting a control command to perform a long seek operation, means () for measuring the mechanical frequency response of the head gimbal assembly to the long seek operation, and means () for comparing the frequency response to a master frequency response ().

System, method, and apparatus for testing a head gimbal assembly

A method and an apparatus are described for the optical examination of structured surfaces of objects, especially of wafers and/or masks. The optical apparatus has an observation beam path ( ) whose central axis ( ) is directed vertically against the surface of the object ( ), an illumination beam ( ) whose central ray ( ) falls vertically on the surface of the object, and an illumination beam ( ) whose central ray ( ) falls obliquely onto the surface of the object ( ). In the observation beam path ( ) the image of the surface of the object ( ) is observed and/or detected. In the observation beam path ( ) a filter device ( ) and/or detector device ( ) is disposed. The optical system has an illumination device ( ) for the simultaneous production of a dark field illumination, a device for the coding ( ) of the illumination beams ( ) being associated with the bright field ( ) and/or the dark field illumination beam ( ).

Method and device for optically examining structured surfaces of objects

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Muenster-Sarmsheim, Germany

Edgar Maehringer-Kunz