Analog Devices,inc.

Analog Devices Global Unlimited Company

Eamonn J Byrne

Patrick Michael Mitchell

Jesus Bonache

Jonathan Ephraim David Hurwitz

Timothy J Cummins

Srikanth Aruna Nittala

Ramesh Kumar Singh

Dara Joseph Brannick

Paraic Brannick

Asif Ahmad

Andrejs Tunkels

Shubha Govindachar

Robert Sythes

Paul Kearney

It is often desirable to distinguish between an open circuit condition and a no signal condition. In both cases an input signal may be absent, but only one of these events represents a failure of the equipment. The present disclosure provides a way to use a difference amplifier to check for open circuit events, without requiring additional circuitry at the input of the amplifier.

Method of and apparatus for detecting open circuit conditions at an input to a signal chain and for detecting channel imbalance in a differential signal chain

Techniques are provided for compensating gain of a combined amplifier and analog-to-digital converter (ADC) circuit, for example, due to additional filtering added to an input of the circuit. In an example, an integrated circuit including an amplifier and ADC can include an amplifier circuit configured to receive an input signal and to amplify the input signal based on an input resistance and a feedback resistance, and to provide an amplified representation of the input signal, and an ADC circuit configured to receive an output of the amplifier, to determine a digital coefficient associated with an additional input resistance coupled to the amplifier, and to provide a compensated digital representation of the amplified representation of the input signal using the digital compensation coefficient.

ADC digital gain error compensation

The invention is a novel scheme of performing an analog to digital conversion of simultaneous sampled analog inputs using multiple sample and hold circuits and a single successive approximation analog to digital converter ('SAR ADC'). Each of the analog inputs are stored on capacitors in the sample and hold circuits, and the sample and holds are sequentially connected to the capacitor DAC. After the digital conversion of the of the input signals stored on a sample and hold, the connected sample and hold is disconnected and the charge on the DAC is reset before the next sample and hold circuit is connected. The process is repeated until all analog inputs have been converted.

Simultaneous sampling analog to digital converter

A switched-capacitor circuit for use in analog-to-digital conversion samples an input signal with respect to a reference voltage such that it significantly reduces a DAC settling time interval during each bit trial. In one exemplary embodiment, the switched-capacitor circuit having first and second groups of capacitor banks is coupled to a first input of a comparator and to a control circuit which provides control signals such that during a switching sequence, an equal value of capacitance is selected from each of the first and second groups of capacitor banks to reduce the DAC settling time interval, thereby improving the conversion rate.

Method and apparatus for segmented, switched analog/digital converter

An emulator couplable to an integrated circuit, the integrated circuit including a micro controller, a DMA controller, memory means and an ADC and the emulator being operable to read a block of data stored in a plurality of memory locations of the memory means and graphically to display a representation of at least a portion of the block of data. An integrated circuit including an ADC and reprogrammable non-volatile memory means, the ADC being arranged to read calibration values from the non-volatile memory means. An integrated circuit including a microcontroller, a DAC selected from a group consisting of a string DAC and a current source DAC and an operational amplifier coupled to the DAC output. An integrated circuit includes analog and digital circuitry, and has only two polysilicon layers on a C-MOS substrate.

Integrated circuit with a high resolution analog to digital convertor, a microcontroller and high density memory and an emulator for an integrated circuit

An integrated circuit including a DMA controller, an ADC having a plurality of conversion channels and address and data ports for connection to external memory means, the DMA controller being arranged to read a channel id from the memory means using the address and data port which channel id is representative of one of the said conversion channels, to pass the read channel id to the ADC, to cause the ADC to perform an analog-to-digital-conversion on the conversion channel represented by the channel id, to receive the conversion result from the ADC and to write the conversion result back to the memory means using the address and data ports. Also, an integrated circuit including a microcontroller having an output port, an address valid output line, a latch coupled to the output port, and a latch control fine coupled to the latch control of the latch the microcontroller being operable to present a first range of address bits at its output port, to activate the latch control line to cause the latch to latch the first range of bits, to present a second range of address bits at its output port and to activate the address valid line to indicate that the combination of the first and second ranges present on the latch outputs and the output port respectively, are valid.

Growing community of inventors

Limerick, Ireland

Eamonn J Byrne