Qualcomm Incorporated

Eai-Hsin Alfred Kuo

Jentsung Lin

Ajay Anant Ingle

Paul Bassett

De Dzwo Hsu

A method and apparatus for controlling system access to a memory that includes receiving first and second instructions, and evaluating whether both instructions can architecturally complete. When at least one instruction cannot architecturally complete, delaying both instructions. When both instructions can architecturally complete and at least one is a write instruction, adjusting a write control of the memory to account for an evaluation delay. The evaluation delay can be sufficient to evaluate whether both instructions can architecturally complete. The evaluation delay can be input to the write control and not the read control of the memory. A precharge clock of the memory can be adjusted to account for the evaluation delay. Evaluating whether both instructions can architecturally complete can include determining whether data for each instruction is located in a cache, and whether the instructions are memory access instructions.

Architecture and method for eliminating store buffers in a DSP/processor with multiple memory accesses

A method of changing execution contexts is provided that includes receiving a context selection input. In a first clock phase, the method includes shifting data from a first latch element of a normal execution context to a second latch element of the normal execution context and shifting shadow data from a third latch element of a shadow execution context to a fourth latch element of the shadow execution context. In a second clock phase, the method includes shifting the shadow data of the fourth latch element of the shadow execution context into the first latch element of the normal execution context and shifting the data of the second latch element of the normal execution context into the third latch element of the shadow execution context. In a particular embodiment, the method may include receiving a test mode selection and shifting test data, such as scan test or automatic test pattern generated data, to a test output.

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San Diego, CA, United States of America

Eai-Hsin Alfred Kuo