Hughes Aircraft Company

Science Applications International Corporation

Dwight H Everett

Paul F Robusto

Michael T Braski

Richard A Tilton

John C Hamacher

J Samuel Mueller

Thomas A Lasko

Bruce A May

A coherence shifting interferometry system determines the thickness or refractive index of an optically transmissive medium. The system utilizes an optical energy source for generating a source beam. The source beam is divided into two beams by reflecting one portion of the beam off of a reflective surface, e.g., a front surface, of an optically transmissive test sample having the unknown thickness or refractive index. A second portion of the beam is transmitted through the sample and reflected off a refractive interface in the sample, e.g., a back surface. The two reflected beams are combined into a composite beam. The composite beam is then directed to a Mach-Zehnder type interferometer, where a portion of the combined beam traverses a fixed optical path length, and another portion traverses a variable optical path length. The variable optical path length is adjusted to realign portions of the two beams and cause interference, and the amount of adjustment provides a measure of the unknown thickness or refractive index.

Measurement system using optical coherence shifting interferometry

An RF laser structure (10) is disclosed which includes an elongated laser excitation cavity (27) and an electrode structure (20) for suppressing extraneous RF discharges outside of the laser cavity. The electrode structure includes an electrode (41) adjacent the elongated laser cavity (27) and extending along the laser cavity; a conductive structure (43, 45) adjacent and conductively coupled to the electrodes (41) for shielding the electrode and for providing smooth conductive surfaces; and a dielectric filler (47) encapsulating the electrode and the conductive structure, and for controlling the electric field generated by the electrode structure so that extraneous discharges are suppressed. Also disclosed is a method for making a laser electrode structure which includes the steps of forming an electrode adjacent the elongated laser cavity, and encapsulating the electrodes with a dielectric potting material.

Method of making a laser electrode structure

An RF laser structure (10) is disclosed which includes an elongated laser excitation cavity (27) and an electrode structure (20) for suppressing extraneous RF discharges outside of the laser cavity. The electrode structure includes an electrode (41) adjacent the elongated laser cavity (27) and extending along the laser cavity; a conductive structure (43, 45) adjacent and conductively coupled to the electrode (41) for shielding the electrode and for providing smooth conductive surfaces; and a dielectric filler (47) encapsulating the electrode and the conductive structure, and for controlling the electric field generated by the electrode structure so that extraneous discharges are suppressed. Also disclosed is a method for making a laser electrode structure which includes the steps of forming an electrode adjacent the elongated laser cavity, and encapsulating the electrode with a dielectric potting material.

RF discharge suppression in low pressure gas devices

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Encinitas, CA, United States of America

Dwight H Everett