Micron Technology Incorporated

Dwayne Kreipl

Zhong-Yi Xia

William J Wilcox

Glenn W Piper

James C Davis

Michael B Pearson

A recessed dielectric antifuse device includes a substrate and laterally spaced source and drain regions formed in the substrate. A recess is formed between the source and drain regions. A gate and gate oxide are formed in the recess and lightly doped source and drain extension regions contiguous with the laterally spaced source and drain regions are optionally formed adjacent the recess. Programming of the recessed dielectric antifuse is performed by application of power to the gate and at least one of the source region and the drain region to breakdown the dielectric, which minimizes resistance between the gate and the channel.

Recessed gate dielectric antifuse

An antifuse circuit includes a terminal, an antifuse, and a select transistor. The antifuse is coupled to the terminal and has an associated program voltage. The select transistor is coupled to the antifuse and has a gate terminal coupled to receive a first select signal. The select transistor operates in a snapback mode of operation in response to an assertion of the first select signal and the program voltage at the terminal.

Antifuse programming circuit with snapback select transistor

A current measuring circuit for a field emission display includes a testing circuit coupled between a high voltage testing source and the display. The testing circuit includes a sampling circuit formed from a sampling impedance coupled in parallel with a high isolation switch. In one embodiment, the sample circuit is on the high voltage side of the testing source. In another embodiment, the sampling circuit is on the return (low voltage) side of the testing source. In normal operation, the switch is closed to provide the testing voltage directly to the display. During testing, the switch is open so that current flows through the sampling impedance. A sensing circuit coupled to the output of the sampling impedance determines a voltage change in response to opening of the switch. In response to a sensed voltage change, a microprocessor-based controller computes the current drawn by the display. A burn-in system includes a bank of displays within a burn-in oven each selectively coupleable to the testing circuit by respective switches. Another testing system includes separate supply and testing sources each coupled to displays by respective switches. The switches are opened and closed such that the displays are always coupled to one or both of the voltage sources to prevent the switches from being exposed to high voltage swings.

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Boise, ID, United States of America

Dwayne Kreipl