The Gerber Scientific Instrument Company

Gerber Scientific, Inc.

The Gerber Scientific Company, Inc.

Dusan A Koso

A system for rapidly generating an image of a pattern in successive lines each being formed of a plurality of pixels, the system storing the previously generated line, producing one or more replacement pixels, and providing successively generated lines of the image by selectively delivering stored pixels or replacement pixels in accordance with commands defining the boundaries of the pattern. The pixels of the previously generated line are updated with the replacement pixels.

Pattern-boundary image generation system and method

An elliptical reflector illumination system for inspection of printed wiring boards including an elliptical reflector element for mounting above the board to be inspected with a region of the board generally at a first elliptical focus of the reflector element. There is a light source mounted generally at a second elliptical focus of the elliptical reflector element for illuminating substantially all facets of the region of the board at the first focus. One or more detectors are provided for sensing light reflected from the illuminated facets of at least a portion of the illuminated region of the board at the first focus.

Elliptical reflector illumination system for inspection of printed

A system which inspects pattern-bearing material that is subject to topical distortions which scans in a first direction a plurality of predefined local regions of a pattern to be inspected to provide an image of each local region and generates a reference image for each of the local regions. The system shifts the position of the image of each local region and the position of its corresponding reference image relative to each other to align the images in the second direction and/or modifies in the first direction the dimension of the image of each local region and the dimension of its corresponding reference image relative to each other to align the images in the first direction. For each local region the system compares the aligned images to detect errors in the pattern independent of misalignment of and topical distortions of each local region.

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Cambridge, MA, United States of America

Dusan A Koso