Agilent Technologies, Inc.

Duaine C Wood

Joseph Michael Gorin

Daniel Lee Pleasant

A synthetic test system for swept-frequency measurements that has a clock synchronization device to enable test boxes and devices that form the synthetic test system to have a common sense of time when conducting swept-frequency tests.

Swept-frequency measurements with improved speed using synthetic instruments

Techniques for triggering that provide time-aligned triggering of a set of components using a bussed topology. Triggering according to the present teachings includes a set of components that each include circuitry for measuring a propagation delay on a trigger bus of a test trigger signal from each of a set of sources of the test trigger signal and a programmable delay circuit for delaying a trigger signal in response to a corresponding delay setting derived from the measured propagation delays.

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Santa Rosa, CA, United States of America

Duaine C Wood