International Business Machines Corporation

Kulite Semiconductor Products, Inc.

Douglas R Firth

Donald Lawrence Wheater

Adam M Hurst

Joseph Carter

Brooks A Cummings

Joe VanDeWeert

Alan R Szary

Raymond J Bulaga

John L Harris

Christina L Newman

Certain implementations of the disclosed technology may include systems and methods for extending a frequency response of a transducer. A method is provided that can include receiving a measurement signal from a transducer, wherein the measurement signal includes distortion due to a resonant frequency of the transducer. The method includes applying a complementary filter to the measurement signal to produce a compensated signal, wherein applying the complementary filter reduces the distortion to less than about +/&#x2212;1 dB for frequencies ranging from about zero to about 60% or greater of the resonant frequency. The method further includes outputting the compensated signal.

Systems and methods for extending frequency response of resonant transducers

An on-chip analog to digital converter (ADC) test circuit comprises a waveform generator for developing a known arbitrary waveform. A switch selectively connects the waveform generator to the ADC in a test mode or an internal analog input to the ADC in an operate mode. In the test mode the ADC develops a known sequence of digital codes. A signature register is connected to an output of the ADC for receiving and compressing the sequence of digital codes during the test mode. The register develops a single compressed signature representative of the entire ADC digital output sequence. The compression method may be used to test ADC monotonicity, linearity, and that there are no missing codes.

Built-in self-test for analog to digital converter

A method and structure for testing an A to D converter containing a plurality of discrete components is provided. The testing methodology includes dividing the circuit into a number of segments of the discrete components (for testing purposes only) with each segment having the same number of discrete components or an unequal but known number of discrete components. The value of the components individually and collectively of each segment is tested and compared with the value of the corresponding components of at least one other segment, and an output signal is generated of the compared value of the segments being tested. Preferably, the components are in a ladder configuration and are either resistors or capacitors. The testing of the components takes place by impressing constant voltage reference signal to at least a portion of one of the segments, sampling and holding this value and then providing a similar reference signal to complementary components of the other of said segments being compared, and comparing the output signal from each of the segments.

Built in self test method and structure for analog to digital converter

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Ithaca, NY, United States of America

Douglas R Firth