Agilent Technologies, Inc.

Hewlett-packard Company

Keysight Technologies, Inc.

Avago Technologies Ecbu IP (singapore) Pte. Ltd.

Other

Avago Technologies Ecbu IP Pte. Ltd.

Douglas Michael Baney

Wayne V Sorin

Gregory Douglas VanWiggeren

Tong Xie

Bogdan Szafraniec

Marshall Thomas DePue

Rodney S Tucker

Ali R Motamedi

Tun Sein Tan

William Ian McAlexander

Bogdan Szfraniec

Gregory Steven Lee

Gary B Gordon

Satoshi Watanabe

John C Eidson

Curt Alan Flory

Jeffrey N Miller

Yoshikatsu Ichimura

Norihide Yamada

Mark Andrew Troll

Richard D Pering

Shigeru Nakagawa

Matthew Richter

Christopher P Kocot

Todd Steven Marshall

Steven A Newton

Gregory D Van Wiggeren

Dieter W Vook

Evan P Thrush

Jonathan Lacey

Jonathan P R Lacey

Harald Rosenfeldt

Greg Douglas Van Wiggeren

John J Dupre

Marshall T Depue

Barbara Baney

Khouzema Unchwaniwala

Dubravk I Babic

A webcam apparatus, having a display surface characterized by a display area, includes an image capture device characterized by an optical axis and a first footprint in a plane perpendicular to the optical axis; and an energy transfer device with a first portion coupled to the image capture device; and a second portion allowing attachment to an edge of a display screen. When attached, the image capture device and the first portion lie against and in contact with the display surface, or in a proximate and parallel plane. An optical axis characterizing the image capture device is aligned with a gaze direction of a user addressing a viewer via the captured images. The first portion of the energy transfer device is transparent at optical wavelengths, and has a second footprint in the plane perpendicular to the optical axis. The first and second footprints are small relative to the display area.

Webcam with improved user engagement and display visibility

An apparatus includes an electrical connector. The electrical connector is configured to electrically couple a signal transmission line to another signal transmission line. The electrical connector includes a first electrical conductor and a second electrical conductor. The first electrical conductor is disposed around a center axis. The first electrical conductor is disposed azimuthally symmetric around the center axis. The second electrical conductor is disposed around the center axis and around the first electrical conductor. The second electrical conductor is disposed azimuthally symmetric around the center axis. Faces on opposing ends of the electrical connector along the center axis are configured to mate the signal transmission line and the second electrical conductor in a first plane and the other signal transmission line and the second electrical conductor in a second plane.

Electrical plug connector

Illustrative systems and methods disclosed herein pertain to calibrating a wafer inspection apparatus. In one exemplary embodiment, a calibration system includes a wafer emulator in the form of a substrate having a first porthole extending from a bottom major surface of the substrate to a top major surface of the substrate. The first porthole accommodates a fixture that holds an optical fiber such that a proximal end of the optical fiber is coplanar to the top major surface of the substrate. The optical fiber has a light emitting profile that emulates a beam profile of a semiconductor laser element. A laser transmitter is coupled to a distal end of the optical fiber and propagates a laser beam through the optical fiber and out of the proximal end of the optical fiber. The wafer inspection apparatus is arranged to receive the laser beam and use the laser beam for calibration purposes.

Systems and methods for calibrating a wafer inspection apparatus

An apparatus for acquiring a desired response to an electromagnetic signal includes an adaptive network that receives a feedback signal and dynamically adjusts an electrical characteristic of the adaptive network in response to the feedback signal, the adaptive network electrically cooperating with an electrical component. A measurement device measures a parameter indicative of a combined response by the electrical component and the adaptive network to an impinging electromagnetic signal. A processor identifies, in accordance with the measured parameter, the feedback signal that reduces the difference between a predetermined response and the combined response to the electromagnetic signal. A feedback generator generates the identified feedback signal and conveys the generated feedback signal to the adaptive network.

Adaptive matching network

Illustrative embodiments disclosed herein pertain to a thermal imaging system that includes a thermal imaging sheet having an array of thermal unit cells for generating a thermal footprint in response to receiving an RF signal. The thermal footprint is composed of an array of hotspots having a first set of hotspots indicative of a radiation characteristic of a first polarization component of the RF signal, and a second set of hotspots indicative of a radiation characteristic of a second polarization component of the RF signal. Each thermal unit cell includes a first RF antenna and a second RF antenna oriented orthogonal with respect to each other. The first RF antenna includes a terminating resistor that generates a hotspot among the first set of hotspots and the second RF antenna includes another terminating resistor that generates a hotspot in the second set of hotspots.

Systems and methods for thermal imaging of RF signals

A method is provided for compensating for impairment of an electrical signal output from a device under test (DUT), the impairment resulting from an impairment network. The method includes measuring an impaired electrical signal received at an electronic analyzer via the impairment network; applying a coded pulse sequence to the impairment network; estimating an impairment transfer function corresponding to the impairment based on the applied pulse sequence; and correcting the measured electrical signal using the impairment transfer function to determine the electrical signal output from the DUT.

Impairment compensation

A method is provided for compensating for impairment of an electrical signal output from a device under test (DUT), the impairment resulting from an impairment network. The method includes measuring an impaired electrical signal received at an electronic analyzer via the impairment network; applying a stimulus signal to the impairment network; estimating an impairment transfer function corresponding to the impairment based on the applied stimulus signal; and correcting the measured electrical signal using the impairment transfer function to determine the electrical signal output from the DUT.

A coherent optical receiver includes a local oscillator (LO) laser configured to provide an LO signal. The LO laser includes a hybrid external cavity and an active gain medium within the hybrid external cavity, where the LO laser is defined between a first optical reflector on a chip including the active gain medium and a second optical reflector not on the chip.

Optical coherent receiver with local oscillator laser having hybrid cavity

An optical spectrum analyzer and a method of spectrally analyzing an optical signal. The optical spectrum analyzer includes a wave shaper such as an optical modulator that shapes an optical signal, a dispersive element such as a dispersive fiber in which the shaped optical signal is dispersed, a detector that provides an output signal indicative of the dispersed shaped optical signal, and a signal processor that analyzes the output signal, for example by calculating a transform such as an inverse Fourier transform or a Fourier transform of the output signal, to provide a frequency spectrum of the optical signal.

Modulation based optical spectrum analyzer

The use of a high power and an incoherent light source to reduce noise associated when investigating unknown molecules in Surface Plasmon Resonance (SPR) systems. High power and incoherent light sources can improve resolution and accuracy of SPR system measurements.

Optical sources for SPR applications

Test instruments constituting an automatic test system are characterized in terms of execution time data. The execution time data is composed of a set of execution times. Each of the execution times is the time required for the test instrument to perform a respective testing operation. The test instruments additionally have the ability to communicate their respective execution time data to such recipients as others of the test instruments, the system controller and recipients outside the automatic test system. Additionally, such test instruments have the ability to communicate test results to at least one other of the test instruments and the ability to process test results received from at least one other of the test instruments. Such characterization, communication and processing allows a system integrator to devise execution time-dependent test programs as part of a test suite that allows test throughput to be maximized.

Test instrument and system responsive to execution time data

A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.

Swept-angle SPR measurement system

Utilizing frequency-dependent diffraction (also referred to as dispersion) to determine the angular position of a retro-reflective object within a scanning space. The technique involves dispersing an electromagnetic beam into a scanning space by frequency. If a retro-reflective object is located within the scanning space, the object will retro-reflect a portion of the dispersed beam having a frequency that is associated with the angular position of the retro-reflective object within the scanning space. The frequency of the retro-reflected beam is used to determine the angular position of the retro-reflective object within the scanning space. When a second beam is dispersed into the scanning space and a portion of the second beam is retro-reflected in the manner just described, a second angular position of the retro-reflective object can be found. Coordinates of the retro-reflective object are determinable by triangulation using the two angular positions. These are absolute, as opposed to relative, coordinates.

Position determination that is responsive to a retro-reflective object

A computer cursor control device includes (1) a light source generating light directed toward a stationary surface, (2) an optional phase modulator, (3) an optional function generator causing the phase modulator to periodically phase shift the light, and (4) a signal processor determining a direction in which the device is moving from a beat frequency or an asymmetry in the light intensity. Another computer cursor control device includes (1) an optical element combining reference and measurement beams to form a heterodyned beam, (2) a phase modulator located in an optical path of the reference beam or the measurement beam, (3) a function generator causing the phase modulator to phase shift the reference beam, and (4) a signal processor determining a direction in which the device is moving from a beat frequency of the heterodyned beam.

Optical navigation based on laser feedback or laser interferometry

A system and method for superheterodyne detection in accordance with the invention. The system comprises a first conversion unit for performing a first heterodyne operation on an optical input signal to generate an electrical IF signal. A second conversion unit is electrically or optically coupled to the first conversion unit. The second conversion unit performs a second heterodyne operation to generate an electrical output signal suitable for signal processing.

Growing community of inventors

Los Altos, CA, United States of America

Douglas Michael Baney