University of Manitoba

Mfi Technologies Corporation

Iders Incorporated

Micron Force Instruments, Inc.

Smart Autonomous Solutions, Inc.

Douglas John Thomson

Bradley Dale Brown

Greg E Bridges

Gregory E Bridges

Christopher O Lada

Lotfollah Shafai

Mehran Fallah-Rad

Robert Donald McLeod

Behzad Kordi

Elham Salimi

Mana Yazdani

Azita Fazelkhah

Samaneh Afshar Delkhah

Gregory Ernest John Bridges

Nicholas Durham

Ra'a A Said

Gregory Ernest Bridges

A dual light source lens-free dielectrophoresis (DEP) flow cytometer for massively parallel single cell analysis. Each cells dielectric is inferred from measuring their altitude and subsequently velocity change due to DEP actuation in a microfluidic channel. Dual LED sources facilitate velocity measurement by producing two shadows for each cell passing through the channel. These shadows are detected using a linear optical array detector. Massively parallel analysis is possible as each pixel of the detector can independently analyze the passing cells. The DEP cytometer is composed of simple modular components and has the potential to be scaled to achieve a significantly high throughput label-free single-cell analyzer.

Parallel single cell lens free optical dielectrophoresis cytometer

A new passive wireless electric field sensor is disclosed. This sensor does not require direct attachment to a source of power which makes it passive. It is composed of a resonator loaded with varactors. The sensor is interrogated by a remotely located device transmitting and receiving the pulses of sine wave in the resonance frequency range of the sensor. Therefore, the sensor can be mounted in the vicinity of high voltage apparatus and interrogated from a safe distance.

Passive wireless sensor for the measurement of AC electric field in the vicinity of high voltage apparatus

A system and a method for measuring properties and health of structures are disclosed. The system comprises a number of sensors connected to a single antenna. Each sensor has a body that defines an electromagnetic resonator. The electromagnetic resonator produces a response signal in response to an interrogation signal. The body is coupled to the structure to so as to allow the parameters of interest alter the resonance properties of the electromagnetic resonators thereby altering the response signal. The sensor further includes a coupler that is coupled to the body. The coupler transfers the interrogation signal into the electromagnetic resonator and transfers the response signal from the electromagnetic resonator. The system further includes an interrogator that generates and transmits the interrogation signal to the sensor. The interrogator also receives the response signal.

Sensing system based on multiple resonant electromagnetic cavities

The system () comprises a sensor () 90&#xd7;90&#xd7;90&#xd7;30 mm as an electromagnetic microwave cavity () with a coupler () with a wire () and an antenna (). Cavity () produces a response signal () in response to an interrogation signal () from interrogator (). Sensor () is coupled to a structure () to allow a strain to alter the resonance properties. 3.6 GHz is used with a detection of a 2.5 kHz change. If not temperature via strain is detected a mechanical amplifier is used with cavity () for temperature compensation. Continuous or intermittent narrowband signals are used as interrogation signals (). Used with bridges for structural health monitoring. Also for aircrafts, dams, buildings, vehicles.

Measuring strain in a structure using a sensor having an electromagnetic resonator

A sub-micron probe apparatus to be added to an existing probe station. In one embodiment, the probe apparatus includes a course positioning unit to be optionally mounted or added to an existing probe station platform. A fine positioning unit is attached to an arm attached to the course positioning unit. A cantilever having a tip is attached to a support structure attached to the fine positioning unit. The course and fine positioning units are used to place the cantilever and tip over a surface of a device under test (DUT). Motion of the cantilever is detected with a motion sensor. An image of the surface of the DUT may be obtained. In addition, an electrical signal carried in an electrical trace on or near the surface of the DUT can be detected. An electrical signal may also be supplied to the electrical trace on or near the surface of the DUT. The field of vision of an optical imager used to image the DUT at the probe area is not obstructed by the probe apparatus.

Method and apparatus for sub-micron imaging and probing on probe station

A scanning force microscope probe cantilever having a reflective structure. In one embodiment, the described scanning force microscope probe cantilever includes a reflective structure on the cantilever. In one embodiment, light is directed to the reflective structure on the cantilever in a direction having a directional component from a fixed end to a free end of the cantilever. In one embodiment, light is reflected from the reflective structure in a direction having a directional component from the free end to a fixed end of the cantilever.

Scanning force microscope probe cantilever with reflective structure

A method and an apparatus for providing non-contact measurement of waveforms proximate to a surface of a sample. In one version, the describe apparatus includes a probe waveform generator that generates probe waveforms with the same repetition rate as a sample waveform to the measured from the sample. The apparatus includes a cantilever with a signal path to carry the probe waveform to a position above the sample surface where the sample waveform is to be measured. The apparatus of the present invention also includes a gate to periodically route the probe waveforms to the cantilever tip. The gate is controlled by a periodic gating signal with a period substantially longer than the signal period of the sample waveform. In one version, the gate is switched at a repetition rate substantially equal to a mechanical resonant repetition rate of the cantilever. Capacitive coupling between the cantilever and the signal line of the sample results in a periodic motion of the cantilever at the gating repetition rate. The periodic mechanical motion may be measured and the electrical waveform flowing in the signal line in the sample is determined. By adjusting the time delay of the pulse waveform impressed upon the tip of the cantilever, the amplitude of the sample waveform can be measured with the present invention during various portion of each cycle of the sample waveform.

Non-contact measurement of electrical waveforms on the surface of a

Displacement of an object from a sensor is detected using a fiber optic a discharge end of which is arranged adjacent to the space from the object. Light passing along the fiber optic is reflected at the discharge end and is also reflected by the object at a position spaced from the discharge end. These two reflected parts of the light interfere causing an interference pattern. The light path from the discharge end to the object is cyclically varied using a sinusoidal dither obtained either by physical movement or by electro-optical means. This allows the output from the photo diode detecting the return reflected light to be analyzed as an alternating signal varying over time rather than as a simple comparison of absolute values as is used in the conventional techniques.

Fiberoptic displacement sensor using interferometric techniques

Built-in current mode quiescent current monitoring circuitry is provided for measuring a circuit's or a subcircuit's quiescent current. Anomalously high quiescent current (Iddq) generally results as a consequence of a manufacturing defect. These defects include those not detected by tests generated using traditional fault models. The technique provided here is based upon generating a proportionally matched current to the circuit under test current by a control loop. The proportionally matched current is then sent to a comparator where it is compared to a reference current, the reference current representing an acceptable quiescent current level. The output of the comparator then indicates whether the quiescent current is above or below the reference current.

Growing community of inventors

Winnipeg, Canada

Douglas John Thomson