Texas Instruments Corporation

Douglas Harvey Newman

Mahalingam Nandakumar

Haowen Bu

Alwin J Tsao

Byron Joseph Palla

Murlidhar Bashyam

A semiconductor device includes a trench extending into a semiconductor layer. A liner layer is on a sidewall of the semiconductor layer within the trench. The liner layer extends from the sidewall to a top surface of the semiconductor layer. An isolation structure is within the trench. The isolation structure is between a first region of the semiconductor layer and a second region of the semiconductor layer. The semiconductor layer includes a third region that couples the first region to the second region of the semiconductor layer. The third region of the semiconductor layer is substantially free of phosphorus contamination.

Shallow trench isolation structure with nitride pullback by implantation treatment

The present disclosure provides a method for adjusting implant parameter conditions in semiconductor processing by wafer and by wafer zone using in-line measurements from previous operations and a feed-forward computer model. The feed-forward model is based on a sensitivity map of in-line measured data and its effect of electrical performance. Feed-forward computer models that adjust implant parameters by wafer and by zone improve both wafer-to-wafer and within wafer electrical uniformity in semiconductor devices.

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Crowley, TX, United States of America

Douglas Harvey Newman