First Solar, Inc.

Douglas Dauson

Zhibo Zhao

Dale Roberts

Benyamin Buller

David K Hwang

Rui Shao

Scott J Mills

Yu Yang

Joseph Kucharczyk

James D Reed

Thomas W Shields

A method and system for real-time, in-line calculations of opto-electronic properties and thickness of the layers of multi-layered transparent conductive oxide stacks of photovoltaic devices is provided. The method and system include taking measurements of each layer of the stack during deposition thereof. The measurements are then used to calculate the opto-electronic properties and thicknesses of the layers in real-time.

Method and system for in-line real-time measurements of layers of multilayered front contacts of photovoltaic devices and calculation of opto-electronic properties and layer thicknesses thereof

An apparatus and method for converting an amorphous transparent conductive oxide to a crystalline form with the assistance of irradiation of a laser.

Apparatus and method for forming a transparent conductive oxide layer over a substrate using a laser

A method for manufacturing a multilayered structure may include forming a transparent conductive oxide layer including cadmium stannate adjacent to a substrate and annealing the structure in an annealing environment including a reducing agent at a temperature greater than 500 degrees C. to crystallize the cadmium stannate.

Photovoltaic device with crystalline layer

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Perrysburg, OH, United States of America

Douglas Dauson