Globalfoundries Inc.

Advanced Micro Devices Corporation

Douglas C Kimbrough

Kevin R Lensing

Richard J Markle

Robert J Chong

Matthew S Ryskoski

Eric Omar Green

Michael Alan Retersdorf

Song Han

Christopher L Wooten

A method includes scanning a test socket after removal of a device under test to generate scan data. The scan data is compared to reference data. A presence of at least a portion of a pin in the test socket is identified based on the comparison. A test system includes a test socket, a scanner, and a control unit. The test socket is operable to receive devices under test. The scanner is operable to scan a test socket after removal of a device under test to generate scan data. The control unit is operable to compare the scan data to reference data and identify a presence of at least a portion of a pin in the test socket based on the comparison.

Method and apparatus for identifying broken pins in a test socket

A method includes determining at least a first characteristic of a device during a first test insertion and storing the first characteristic. The device is identified during a second test insertion. The first characteristic is retrieved responsive to the identification of the device. A test program for the second insertion is configured based on the first characteristic. The configured test program is executed to test the device during the second test insertion.

Method and apparatus for employing previous test insertion results for testing a device

A method includes retrieving a group test parameter determined based on test results associated with a plurality of integrated circuit devices. A particular integrated circuit device is tested using a test program and the group test parameter.

Method and apparatus for dynamically determining tester recipes

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Austin, TX, United States of America

Douglas C Kimbrough