Intel Corporation

Dorit Shapira

Efraim Rotem

Doron Rajwan

Eliezer Weissmann

Nadav Shulman

Krishnakanth Venkata Sistla

Nir Rosenzweig

Avinash N Ananthakrishnan

Esfir Natanzon

Jeremy J Shrall

Chris MacNamara

Vasudevan Srinivasan

Jorge Pedro Rodriguez

Nikhil Gupta

Tomer Ziv

Anand K Enamandram

Xiuting C Man

Deepak Ganapathy

Daniel Cartagena

John Joseph Browne

Ankush Varma

James G Hermerding, Ii

Eric DiStefano

Lily Pao Looi

Jonathan M Eastep

Srihari Makineni

Tomasz Kantecki

Douglas Raymond Moran

Federico Ardanaz

Tal Kuzi

Shrikant M Shah

Kosta Luria

Itai Feit

David Hunt

Allen W Chu

Maxim Levit

Asma Al-Rawi

Shmuel Zobel

Bart Plackle

Shmulik Zobel

Anatoly Burakov

Bryan T Butters

In an embodiment, a processor includes processing cores, and a central control unit to: concurrently execute an outer control loop and an inner control loop, wherein the outer control loop is to monitor the processor as a whole, and wherein the inner control loop is to monitor a first processing core included in the processor; determine, based on the outer control loop, a first control action for the first processing core included in the processor; determine, based on the inner control loop, a second control action for the first processing core included in the processor; based on a comparison of the first control action and the second control action, select one of the first control action and the second control action as a selected control action; and apply the selected control action to the first processing core. Other embodiments are described and claimed.

Multi-level loops for computer processor control

An apparatus is provided, where the apparatus includes a plurality of components; a first sensing system to measure first power consumed by first one or more components of the plurality of components; a second sensing system to measure second power consumed by the apparatus; an analog-to-digital converter (ADC) to generate an identification (ID) that is representative of the second power consumed by the apparatus; and a controller to allocate power budget to one or more components of the plurality of components, based on the measurement of the first power and the ID.

Power management based on real time platform power sensing

Examples herein relate to assigning, by a system agent of a central processing unit (CPU), an operating frequency to a core group based priority level of the core group while avoiding throttling of the system agent. Avoiding throttling of the system agent can include maintaining a minimum performance level of the system agent. A minimum performance level of the system agent can be based on a minimum operating frequency. Assigning, by a system agent of a central processing unit, an operating frequency to a core group based priority level of the core group while avoiding throttling of the system agent can avoid a thermal limit of the CPU. Avoiding thermal limit of the CPU can include adjusting the operating frequency to the core group to avoid performance indicators of the CPU. A performance indicator can indicate CPU utilization corresponds to Thermal Design Point (TDP).

Platform slicing of central processing unit (CPU) resources

An apparatus system is provided which comprises: a first component and a second component; a first circuitry to assign the first component to a first group of components, and to assign the second component to a second group of components; and a second circuitry to assign a first maximum frequency limit to the first group of components, and to assign a second maximum frequency limit to the second group of components, wherein the first component and the second component are to respectively operate in accordance with the first maximum frequency limit and the second maximum frequency limit.

Dynamic maximum frequency limit for processing core groups

In one embodiment, a processor includes: at least one core; a stress detector coupled to the at least one core to receive at least one of a voltage and a temperature at which the processor is to operate, calculate an effective stress based at least in part thereon, and maintain an accumulated effective stress; a clock circuit to calculate a lifetime duration of the processor in a platform; a meter to receive the accumulated effective stress, the lifetime duration and a stress model value and generate a control signal based on a comparison of the accumulated effective stress and the stress model value; and a power controller to control at least one parameter of a turbo mode of the processor based at least in part on the control signal. Other embodiments are described and claimed.

System, apparatus and method for controlling a processor based on effective stress information

In an embodiment, a processor includes at least one execution unit to execute instructions, and an interrupt generation unit. The interrupt generation unit may be to: receive a plurality of values indicating thermal status values for a memory unit at multiple points in time across a first time window; determine a running average value based on the plurality of values indicating thermal status values in the memory unit; and in response to a determination that the running average value has exceeded a high thermal status threshold value, generate a thermal interrupt indicating a high thermal status event in the processor. Other embodiments are described and claimed.

Generation of processor interrupts using averaged data

A method and apparatus for providing power state information using in-band signaling are described. In one embodiment, an integrated circuit (IC) device comprises a controller operable to receive a command from a platform control bus, the command requesting data that is unrelated to information about a power state in which the IC resides; and control logic operable to obtain data for inclusion in a response to the command, wherein the controller is operable to send the response over a bus, the response containing at least a portion of the data responsive to the command and containing power state information for the IC.

Method and apparatus for providing power state information using in-band signaling

An apparatus and method for a user configurable reliability control loop. For example, one embodiment of a processor comprises: a reliability meter to track accumulated stress on components of the processor based on measured processor operating conditions; and a controller to receive stress rate limit information and to responsively specify a set of N operating limits on the processor in accordance with the accumulated stress and the stress rate limit information; and performance selection logic to output one or more actual operating conditions for the processor based on the N operating limits specified by the controller.

Apparatus and method for a user configurable reliability control loop

In one embodiment, a processor includes at least one core, at least one thermal sensor, and a power controller including a first logic to dynamically update a time duration for which the at least one core is enabled to be in a turbo mode. Other embodiments are described and claimed.

Dynamically updating at least one power management operational parameter pertaining to a turbo mode of a processor for increased performance

In one embodiment, a processor includes multiple cores and a power control unit (PCU) coupled to the cores. The PCU has a stress detector to receive a voltage and a temperature at which the processor is operating and calculate lifetime statistical information including effective reliability stress, maintain the lifetime statistical information over multiple boot cycles of a computing system such as personal computer, server computer, tablet computer, smart phone or any other computing platform, control one or more operating parameters of the processor based on the lifetime statistical information, and communicate at least a portion of the lifetime statistical information to a user and/or a management entity via an interface of the processor. Other embodiments are described and claimed.

Providing lifetime statistical information for a processor

Growing community of inventors

Atlit, Israel

Dorit Shapira