Western Digital Technologies, Inc.

Dongying Li

Sukumar Rajauria

Qing Dai

Mehdi Habibollahzadeh

Erhard Theodor Schreck

Xiaokun L Chew

Jung-Seo Park

Ruihua Li

Yixiang Zhang

A data storage device may include an enclosure and a metal organic framework (MOF) container situated within an enclosure interior. The MOF container contains a MOF configured to store captive molecular units and to release the captive molecular units in gaseous form into the enclosure interior. A method of manufacturing the data storage device may include charging the MOF, attaching the MOF container to the enclosure interior, and sealing the enclosure after attaching the MOF container to the interior of the enclosure. A method of adjusting an amount of gas in a sealed data storage device may comprise including a MOF container within an interior of the sealed data storage device, the MOF container containing a MOF, charging the MOF, and, after the sealed data storage device has been placed into service, the MOF releasing captive molecular units into the interior of the sealed data storage device.

Devices and methods for metal organic framework (MOF) based oxygen replenishment in data storage devices

A data storage device may include a container comprising a gas-permeable membrane and a temperature-sensitive gas-releasing substance inside of the container. The temperature-sensitive gas-releasing substance is characterized by a gas-release profile wherein, below a critical temperature, the temperature-sensitive gas-releasing substance releases essentially none of a particular gas, and above the critical temperature, and within a range of expected operating temperatures of the data storage device, the temperature-sensitive gas-releasing substance releases the particular gas in quantities that generally increase with increasing temperature.

Passive and active gas compensation techniques for data storage devices

A data storage device may include a disk, an actuator arm assembly comprising a magnetic recording head, a laser diode, and one or more processing devices configured to: initiate a write operation, wherein the write operation is associated with a first temperature of the laser diode; measure a resistance of the laser diode, wherein the resistance corresponds to a temperature of the laser diode; detect, based at least in part on measuring the resistance, a change in the temperature of the laser diode relative to the first temperature; and in response to detecting the change, adjust the temperature of the laser diode during the write operation.

Measuring laser diode temperature and predicting mode hops using laser diode resistance

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San Jose, CA, United States of America

Dongying Li